Rough Surface and Delay Spread
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概要
- 論文の詳細を見る
This paper is concerned with the numerical analysis of electromagnetic wave scattering from a rough surface by using ray tracing method. The method is effective when the average height and correlation length of the rough surface are relatively large compared with the wavelength. First we check the accuracy of the present method in comparison with a rigorous solution to the strip diffraction problem. Second we show some examples of traced rays including reflected and diffracted ones. Finally we also show numerical examples for scattering and propagation characteristics peculiar to the rough surface problem.
- 社団法人映像情報メディア学会の論文
- 2000-01-27
著者
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UCHIDA Kazunori
Fukuoka Institute of Technology
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Uchida K
Advanced Lsi Technology Laboratory Toshiba Corporation
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TATEIBA Mitsuo
Kyushu University
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Tateiba M
Department Of Computer Science And Communication Engineering Kyushu University
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YOON Kwang-yeol
Kyushu University
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Uchida Ken
Corporate R&d Center Toshiba Corporation
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