Analysis of Plane Wave Scattering by a Conducting Thin Plate and a Criterion for Ray Tracing Method
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概要
- 論文の詳細を見る
This paper presents almost rigorous Wiener-Hopf solutions to the plane wave scattering by a conducting finite thin plate. The final field expressions are given in an analytically compact form and the results are accurate as long as the plate width is greater than the wavelength. Numerical examples are given for the near and far field distributions. A criterion is also proposed to estimate under what condition the ray tracing method holds.
- 社団法人電子情報通信学会の論文
- 1998-04-25
著者
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Fukuma T
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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Fujii T
Japan Telecom Co. Ltd. Tokyo Jpn
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Fujii T
Nikon Corporation
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FUJII Toru
Nikon Corporation
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UCHIDA Kazunori
The author is with the Faculty of Information Engineering at Fukuoka Institute of Technology
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IMAI Tetsuro
The authors are with NTT Mobile Communications Network Inc.
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FUJII Teruya
The authors are with NTT Mobile Communications Network Inc.
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HATA Masaharu
The authors are with NTT Mobile Communications Network Inc.
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Uchida K
Advanced Lsi Technology Laboratory Toshiba Corporation
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Imai T
The Authors Are With Ntt Mobile Communications Network Inc.
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Hata M
Ntt Mobile Communications Network Inc. Tokyo Jpn
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Fujii T
Department Of Electronic Science And Engineering Kyoto University
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Uchida Ken
Corporate R&d Center Toshiba Corporation
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