Ray Tracing Analysis of Large-Scale Random Rough Surface Scattering and Delay Spread
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概要
- 論文の詳細を見る
We have discussed a ray tracing method to estimate the scattering characteristics from random rough surface. It has been shown from the traced rays that the diffracted rays dominate over the reflected rays. For the field evaluation, we have used the Fresnel function for the diffracted coefficient and the Fresnel's reflection coefficients. Nnmerical examples have been carried out for the scattering characteristics of an ocean wave-like rough surface and the delay spared characteristics of a building-like surface. In the present work we have demonstrated that the ray tracing method is effective to numerical analysis of a rough surface scattering.
- 社団法人電子情報通信学会の論文
- 2001-02-01
著者
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UCHIDA Kazunori
The Faculty of Information Engineering at Fukuoka Institute of Technology
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Uchida K
Advanced Lsi Technology Laboratory Toshiba Corporation
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TATEIBA Mitsuo
Kyushu University
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Tateiba M
Department Of Computer Science And Communication Engineering Kyushu University
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Tateiba Mitsuo
The Department Of Computer Science And Communication Engineering Faculty Of Information Science And
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YOON Kwang-yeol
the Department of Electric Engineering, Keimyung University
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Uchida Kazunori
The Faculty Of Engineering At Fukuoka Institute Of Technology
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Uchida Ken
Corporate R&d Center Toshiba Corporation
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