Hata M | Ntt Mobile Communications Network Inc. Tokyo Jpn
スポンサーリンク
概要
関連著者
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Fukuma T
Dep. Of Electronic Sci. And Engineering Kyoto Univ. Katsura Nishikyo Kyoto 615-8510 Japaninnovative
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Fujii T
Japan Telecom Co. Ltd. Tokyo Jpn
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Fujii T
Nikon Corporation
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FUJII Toru
Nikon Corporation
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HATA Masaharu
The authors are with NTT Mobile Communications Network Inc.
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Uchida K
Advanced Lsi Technology Laboratory Toshiba Corporation
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Imai T
The Authors Are With Ntt Mobile Communications Network Inc.
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Hata M
Ntt Mobile Communications Network Inc. Tokyo Jpn
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Fujii T
Department Of Electronic Science And Engineering Kyoto University
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Uchida Ken
Corporate R&d Center Toshiba Corporation
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IMAI Tetsuro
NTT Mobile Communications Network Inc.
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FUJII Teruya
NTT Mobile Communications Network Inc.
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HATA Masaharu
NTT Mobile Communications Network Inc.
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MAEDA Hiroshi
Production Engineering Research Laboratory, Matsushita Electric Works, Ltd.
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Maeda H
Fukuoka Inst. Of Technol. Fukuoka‐shi Jpn
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MAEDA Hiroshi
Faculty of Pharmaceutical Sciences, Okayama University
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UCHIDA Kazunori
The Faculty of Information Engineering at Fukuoka Institute of Technology
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MAEDA Hiroshi
The Faculty of Information Engineering at Fukuoka Institute of Technology
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UCHIDA Kazunori
The author is with the Faculty of Information Engineering at Fukuoka Institute of Technology
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IMAI Tetsuro
The authors are with NTT Mobile Communications Network Inc.
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FUJII Teruya
The authors are with NTT Mobile Communications Network Inc.
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UCHIDA Kazunori
Faculty of Information Engineering, Fukuoka Inst. of Tech.
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Uchida Kazunori
The Faculty Of Engineering At Fukuoka Institute Of Technology
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Uchida Kazunori
Faculty Of Engineering Fukuoka Institute Of Technology
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Maeda Hiroshi
Faculty Of Pharmaceutical Sciences Okayama University:kumamoto University Medical School
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Maeda Hiroshi
The Faculty Of Engineering Kyushu University
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Maeda Hiroshi
Faculty Of Engineering Kyushu Institute Of Technology
著作論文
- Analysis of Electromagnetic Wave Scattering by a Conducting Thin Plate and Image Coefficient for Ray Tracing Method
- Analysis of Plane Wave Scattering by a Conducting Thin Plate and a Criterion for Ray Tracing Method
- Wiener-Hopf Solutions to Electromagnetic Wave Scattering by a Finite Conducting Thin Plate in Case of a Line Source