Takagi Shin-ichi | Department Of Electrical Engineering University Of Tokyo
スポンサーリンク
概要
関連著者
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Takagi Shin-ichi
Department Of Electrical Engineering University Of Tokyo
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TAKAGI Shin-ichi
Department of Frontier Informatics, Graduate School of Frontier Science, The University of Tokyo
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Koga Junji
Advanced Lsi Technology Laboratory Corporate R & D Center Toshiba Corporation
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Ishihara Takamitsu
Advanced Lsi Technology Laboratory Corporate Research & Development Center
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Takagi S
Process & Manufacturing Center Semiconductor Company Toshiba Corporation
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ISHIHARA Takamitsu
Advanced LSI Technology Laboratory, Research and Development Center, Toshiba Corporation
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KOGA Junji
Advanced LSI Technology Laboratory, Research and Development Center, Toshiba Corporation
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Koga J
Advanced Lsi Technology Laboratory Research And Development Center Toshiba Corporation
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Ishihara Takamitsu
Advanced Lsi Technology Laboratory Research And Development Center Toshiba Corporation
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Uchida Ken
Advanced LSI laboratory, Corporate R&D Center, Toshiba Corporation, 1 Komukai Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan
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NAKABAYASHI Yukio
Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation
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SUGANO Takuo
Department of Electrical and Electronic Engineering, Toyo University
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UCHIDA Ken
Advanced LSI Technology Laboratory, Research & Development Center, Toshiba Corporation
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NAKASHIMA Hisao
Optoelectronics Joint Research Laboratory
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Ohyama Hideaki
Department Of Physics Faculty Of Science Science University Of Tokyo
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Narusawa Tadashi
Optoelectronics Joint Research Laboratory
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Narusawa Tadashi
Optoelectronics Joint Research Laboratory:(present Address) Kawasaki Laboratory Optoelectronics Deve
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Uchida K
Advanced Lsi Technology Laboratory Toshiba Corporation
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Nakashima Hisao
Optoelectronics Joint Research Laboratory:(present Address) Institute Of Scientific And Industrial R
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Nakabayashi Yukio
Advanced Lsi Technology Laboratory Corporate R&d Center Toshiba Corporation
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Nakabayashi Yukio
Advanced Lsi Technology Laboratory Research And Development Center Toshiba Corporation
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Sugano Takuo
Department Of Electrical Engineering University Of Tokyo
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Uchida Ken
Advanced Lsi Technology Laboratory Toshiba Corporation
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Uchida Ken
Corporate R&d Center Toshiba Corporation
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Uchida Ken
Advanced LSI Technology Laboratory, Corporate Research and Development Center, Toshiba Corporation, 8 Shinsugita-cho, Isogo-ku, Yokohama 235-8522, Japan
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Takagi Shin-ichi
Department of Frontier Informatics, Graduate School of Frontier Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
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Koga Junji
Advanced LSI Technology Laboratory, Corporate Research and Development Center, Toshiba Corporation, 8 Shinsugita-cho, Isogo-ku, Yokohama 235-8522, Japan
著作論文
- Physical Origins of Surface Carrier Density Dependences of Interface- and Remote-Coulomb Scattering Mobility in Si MOS Inversion Layer
- Unified Roughness Scattering Model Incorporating Scattering Component Induced by Thickness Fluctuation in SOI MOSFETs
- Quantitative Understanding of Mobility Degradation in High Effective Electric Field Region in MOSFETs with Ultra-thin Gate Oxides
- Interface Analysis of Al_2O_3/InP Structure Prepared by Molecular Beam Deposition
- Unified Roughness Scattering Model Incorporating Scattering Component Induced by Thickness Fluctuations in Silicon-on-Insulator Metal–Oxide–Semiconductor Field-Effect Transistors
- Physical Origin of Drive Current Enhancement in Ultra-thin Ge-On-Insulator (GOI) MOSFETs under Full Ballistic Transport