A Method for Measuring Dielectric Constants of Low-Loss Materials by Forced Resonance
スポンサーリンク
概要
著者
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Kim K‐c
Yeungnam Univ. Kyongbuk Kor
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UCHIDA Kazunori
Faculty of Information Engineering, Fukuoka Inst. of Tech.
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Kim Ki-chai
Faculty Of Engineering Fukuoka Institute Of Technology
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TOKUMARU Shinobu
Faculty of Engineering, Keio University
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Tokumaru S
Keio Univ. Yokohama‐shi Jpn
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Uchida Kazunori
Faculty Of Engineering Fukuoka Institute Of Technology
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- FVTD Simulation for Random Rough Dielectric Surface Scattering at Low Grazing Angle(Special Issue on Problems of Random Scattering and Electromagnetic Wave Sensing)
- A Method for Measuring Dielectric Constants of Low-Loss Materials by Forced Resonance
- On Optical Ray Fields