Conduction Mechanism in Extremely Thin Poly-Si Wires : Width Dependence of Coulomb Blockade Effect
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概要
- 論文の詳細を見る
- 2001-09-25
著者
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YOKOYAMA Shin
Research Center for Nanodevices and Systems, Hiroshima University
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NAKAJIMA Anri
Research Center for Nanodevices and Systems, Hiroshima University
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Yokoyama Shin
Research Center For Integrated Systems Hiroshima University
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Yokoyama S
Research Center For Nanodevices And Systems Hiroshima University
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Nakajima A
Research Center For Nanodevices And Systems Hiroshima University
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Nakajima Anri
Research Center For Nanodevices And Systems Hiroshima University
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Nomura Akihiro
Research Center For Nanodevices And Systems Hiroshima University
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KAWAMURA Kensaku
Research Center for Nanodevices and Systems, Hiroshima University
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KIDERA Toshirou
Research Center for Nanodevices and Systems, Hiroshima University
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Kidera Toshirou
Research Center For Nanodevices And Systems Hiroshima University
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Kawamura Kensaku
Research Center For Nanodevices And Systems Hiroshima University
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