Influence of bulk bias on NBTI of pMOSFETs with ultrathin SiON gate dielectric
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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Zhu Shiyang
Research Center For Nanodevices And Systems Hiroshima University
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Nakajima Anri
Research Center For Nanodevices And Systems Hiroshima University
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Miyake Hideharu
Elpida Memory Inc.
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Ohashi Takuo
Elpida Memory Inc.
関連論文
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