Yokoyama S | Research Center For Nanodevices And Systems Hiroshima University

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Low Voltage Saturation of Ob(Zr_xTi_O_3 Films on(100)Ir/(100)(ZrO_2)_(Y_2O_3)_x/(100)Si Substrate Structure Prepared by Reactive Sputtering
High-Rate GaAs Epitaxial Lift-Off Technique for Optoelectronic Integrated Circuits
High-Efficiency Micromirrors and Branched Optical Waveguides on Si Chips
Single-Chip Integration of Light-Emitting Diode, Waveguide and Micrormirrors
Fabrication and Evaluation of Three-Dimensional Optically Coupled Common Memory
Evaluation of Plasma-Induced Damage by Medium-Energy Ion Scattering
Comparative Studies of Perfluorocarbon Alternative Gas Plasmas for Contact Hole Etch
Quantitative Evaluation of Dopant Loss in 5-10 keV As Ion Implantation for Low-Resistive, Ultrashallow Source/Drain Formation
An Experimental Pattern Recognition System Using Bidirectional Optical Bus Lines
Experimental Pattern Recognition System Using Bidirectional Optical Bus Lines
Optically Interconnected Kohonen Net for Pattern Recognition
High-Efficiency Micromirrors and Branched Optical Waveguides on Si Chips
New RAM-bus Memory System with Interchip Optical Interconnection
Micron-Size Optical Waveguide for Optoelectronic Integrated Circuit
Medium-Energy Ion Spectroscopy Using Ion Implanter
Organic Contamination Dependence of Process-Induced Interface Trap Generation in Ultrathin Oxide Metal Oxide Semiconductor Transistors
Fabrication Technologies for Double-SiO_2-Barrier Metal-Oxide-Semiconductor Transistor with a Poly-Si Dot
Thickness Dependence of Material Properties of Epitaxial Pb(Zr_xTi_)O_3 Films on Ir/(100) (ZrO_2)_(Y_2O_3)_x(100)Si Structures
Calculation of Electrical Properties of Novel Double-Barrier Metal Oxide Semiconductor Transistors
Effects of Hydrogen and Bias on Single-Crystal Al Growth on Vicinal Si by DC Magnetron Sputtering
Influence of Organic Contaminant on Trap Generation in Thin SiO_2 of Metal-Oxide-Semiconductor Capacitors
Influence of Organic Contaminant on Breakdown Characteristics of MOS Capacitors with Thin SiO_2
Influence of Organic Contaminant on Breakdown Characteristics of MOS Capacitors with Thin SiO_2
Carrier Mobility in Metal-Oxide-Semiconductor Field Effect Transistor with Atomic-Layer-Deposited Si-Nitride Gate Dielectrics
Conduction Mechanism in Extremely Thin Poly-Si Wires : Width Dependence of Coulomb Blockade Effect
Low-Temperature Selective Deposition of Silicon by Time-Modulation Exposure of Disilane and Formation of Silicon Nanowires

もっと見る

スポンサーリンク