Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
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概要
- 論文の詳細を見る
Process variation is becoming a primal concern in timing closure of LSI (Large Scale Integrated Circuit) with the progress of process technology scaling. To overcome this problem, SSTA (Statistical Static Timing Analysis) has been intensively studied since it is expected to be one of the most efficient ways for performance estimation. In this paper, we study variation of output transition-time. We firstly clarify that the transition-time variation can not be expressed accurately by a conventional first-order sensitivity-based approach in the case that the input transition-time is slow and the output load is small. We secondly reveal quadratic dependence of the output transition-time to operating margin in voltage. We finally propose a procedure through which the estimation of output transition-time becomes continuously accurate in wide range of input transition-time and output load combinations.
- (社)電子情報通信学会の論文
- 2009-04-01
著者
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KANAMOTO Toshiki
Renesas Technology Corporation
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HASHIMOTO Masanori
Osaka University
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SATO Takashi
Kyoto University
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SATO Takashi
Tokyo Institute of Technology
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Sakata Tsuyoshi
Fujitsu Microelectronics Ltd.
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KUROKAWA Atsushi
Sanyo Semiconductor Co. Ltd.
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Sato T
Photonic Lattice Inc.:niche Tohoku University
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Masuda Hiroo
Renesas Technol. Corp. Kodaira‐shi Jpn
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Masuda Hiroo
Renesas Technology Corp.
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OKUMURA Takaaki
Semiconductor Technology Academic Research Center
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TAKAFUJI Hiroshi
RICOH Company Ltd.
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NAKASHIMA Hidenari
NEC Electronics Corp.
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ONO Nobuto
Jedat Inc.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd.
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Hashimoto Masanori
Osaka Univ. Suita‐shi Jpn
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Kanamoto Toshiki
Mirai‐selete Sagamihara‐shi Jpn
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Kanamoto Toshiki
Renesas Technology Corp.
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Kanamoto Toshiki
Renesas Design Corp.
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Nakashima Hidenari
Integrated Research Institute Tokyo Institute Of Technology
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Kurokawa Atsushi
Sanyo Electric Co. Ltd
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Sato Takashi
Institute Of Physics And Tsukuba Research Center For Interdisciplinary Materials Science University
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Hashimoto Masanori
Osaka Univ.
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Okumura Takaaki
Semiconductor Technol. Academic Res. Center
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Masuda Hiroo
Renesas Electronics Corporation, Takasaki, Gunma 370-0021, Japan
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