NAKASHIMA Hidenari | NEC Electronics Corp.
スポンサーリンク
概要
関連著者
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NAKASHIMA Hidenari
NEC Electronics Corp.
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Nakashima Hidenari
Integrated Research Institute Tokyo Institute Of Technology
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HASHIMOTO Masanori
Osaka University
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Okada Kenichi
Integrated Research Institute Tokyo Institute Of Technology
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SATO Takashi
Kyoto University
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Sakata Tsuyoshi
Fujitsu Microelectronics Ltd.
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Sato T
Photonic Lattice Inc.:niche Tohoku University
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Masuda Hiroo
Renesas Technology Corp.
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Inoue Junpei
Integrated Research Institute Tokyo Institute Of Technology
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Hashimoto Masanori
Osaka Univ. Suita‐shi Jpn
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Masu Kazuya
Solutions Research Laboratory Tokyo Institute Of Technology
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Okada Kenichi
Tokyo Inst. Of Technol. Yokohama‐shi Jpn
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Sato Takashi
Institute Of Physics And Tsukuba Research Center For Interdisciplinary Materials Science University
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Hashimoto Masanori
Osaka Univ.
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Okumura Takaaki
Semiconductor Technol. Academic Res. Center
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KANAMOTO Toshiki
Renesas Technology Corporation
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Masu Kazuya
Integrated Research Institute
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KUROKAWA Atsushi
Sanyo Semiconductor Co. Ltd.
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Masuda Hiroo
Renesas Technol. Corp. Kodaira‐shi Jpn
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OKUMURA Takaaki
Semiconductor Technology Academic Research Center
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TAKAFUJI Hiroshi
RICOH Company Ltd.
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INOUE Junpei
Integrated Research Institute Laboratory, Tokyo Institute of Technology
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NAKASHIMA Hidenari
Integrated Research Institute Laboratory, Tokyo Institute of Technology
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Kurokawa Atsushi
Sanyo Electric Co. Ltd.
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Kanamoto Toshiki
Mirai‐selete Sagamihara‐shi Jpn
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Kanamoto Toshiki
Renesas Technology Corp.
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Kanamoto Toshiki
Renesas Design Corp.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd
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Masuda Hiroo
Renesas Electronics Corporation, Takasaki, Gunma 370-0021, Japan
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SATO Takashi
Tokyo Institute of Technology
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Tanaka Masakazu
Panasonic Corp.
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FURUKAWA Katsuhiro
Jedat Inc.
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HACHIYA Koutaro
Jedat Inc.
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ONO Nobuto
Jedat Inc.
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Hachiya Kotaro
Jedat Inc.
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Kyogoku Takanori
Integrated Research Institute Laboratory Tokyo Institute Of Technology
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Masu Kazuya
Precision And Intelligence Laboratory Tokyo Institute Of Technology
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OKADA Kenichi
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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UEZONO Takumi
Integrated Research Institute, Tokyo Institute of Technology
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Goto Satoshi
Graduate School Of Information Production And System Waseda University
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Uezono Takumi
Integrated Research Institute Tokyo Institute Of Technology
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KOBAYASHI Hiroyuki
Nihon Synopsys Co., Ltd.
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IWAI Jiro
Mathematical Systems Inc.
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OKUMURA Takaaki
Fujitsu VLSI Ltd.
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HACHIYA Koutaro
NEC Electronics Corp.
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KYOGOKU Takanori
Integrated Research Institute Laboratory, Tokyo Institute of Technology
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TAKAGI Naohiro
Integrated Research Institute, Tokyo Institute of Technology
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KYOGOKU Takanori
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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INOUE Junpei
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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NAKASHIMA Hidenari
Precision and Intelligence Laboratory, Tokyo Institute of Technology
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Takagi Naohiro
Integrated Research Institute Tokyo Institute Of Technology
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Soda Masaaki
Renesas Electronics Corp. Kawasaki‐shi Jpn
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Ohshima Takayuki
Nec Electronics Corp.
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SODA Masaaki
NEC Electronics Corp.
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Kobayashi Hiroyuki
Nihon Synopsys Co. Ltd.
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Goto Satoshi
Graduate School of Infomlation Production and Systems Waseda University
著作論文
- Impact of Self-Heating in Wire Interconnection on Timing
- An Approach for Reducing Leakage Current Variation due to Manufacturing Variability
- Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
- Proposal of Metrics for SSTA Accuracy Evaluation(Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa)
- Wire Length Distribution Model for System LSI(Interconnect, VLSI Design and CAD Algorithms)
- Evaluation of X Architecture Using Interconnect Length Distribution(Interconnect, VLSI Design and CAD Algorithms)
- Circuit Performance Prediction Considering Core Utilization with Interconnect Length Distribution Model(Prediction and Analysis, VLSI Design and CAD Algorithms)
- Optimization Technique of Number of Interconnect Layers and Circuit Area Based on Wire Length Distribution
- Fast Methods to Estimate Clock Jitter due to Power Supply Noise(Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa)