Kurokawa Atsushi | Sanyo Electric Co. Ltd
スポンサーリンク
概要
関連著者
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Kurokawa Atsushi
Sanyo Electric Co. Ltd.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd
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Huang Zhangcai
Research Center Of Information Production And Systems Waseda University
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Inoue Yasuaki
Graduate School Of Ips Waseda University
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Masuda Hiroo
Renesas Technology Corp.
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KANAMOTO Toshiki
Renesas Technology Corporation
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Inoue Yasuaki
Graduate School Of Information Production And Systems Waseda University
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Kanamoto Toshiki
Mirai‐selete Sagamihara‐shi Jpn
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Kanamoto Toshiki
Renesas Technology Corp.
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Kanamoto Toshiki
Renesas Design Corp.
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INOUE Yasuaki
Graduate School of Information, Production and Systems, Waseda University
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HASHIMOTO Masanori
Osaka University
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KUROKAWA Atsushi
Sanyo Semiconductor Co. Ltd.
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KUROKAWA Atsushi
STARC
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KASEBE Akira
Meitec Corp.
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KUROKAWA Atsushi
Semiconductor Technology Academic Research Center (STARC)
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Hashimoto Masanori
Osaka Univ. Suita‐shi Jpn
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Hashimoto Masanori
Osaka Univ.
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Yang Yun
Waseda Univ. Kitakyushu‐shi Jpn
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MASUDA Hiroo
STARC
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INOUE Yasuaki
Waseda University
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SATO Takashi
Kyoto University
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HUANG Zhangcai
Graduate School of Information, Production and Systems, Waseda University
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Sakata Tsuyoshi
Fujitsu Microelectronics Ltd.
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JIANG Minglu
Graduate School of Production, Information and Systems, Waseda University
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HUANG Zhangcai
Waseda University
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Jiang Minglu
Graduate School Of Information Production And Systems Waseda University
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Huang Zhangcai
Waseda Univ. Kitakyushu‐shi Jpn
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Sato T
Photonic Lattice Inc.:niche Tohoku University
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Masuda Hiroo
Renesas Technol. Corp. Kodaira‐shi Jpn
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Huang Zhangcai
Graduate School Of Information Production And Systems Waseda University
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OKUMURA Takaaki
Semiconductor Technology Academic Research Center
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TAKAFUJI Hiroshi
RICOH Company Ltd.
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NAKASHIMA Hidenari
NEC Electronics Corp.
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Hachiya Kotaro
Jedat Inc.
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Nakashima Hidenari
Integrated Research Institute Tokyo Institute Of Technology
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Sato Takashi
Institute Of Physics And Tsukuba Research Center For Interdisciplinary Materials Science University
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Okumura Takaaki
Semiconductor Technol. Academic Res. Center
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Masuda Hiroo
Renesas Electronics Corporation, Takasaki, Gunma 370-0021, Japan
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Yang Yun
Graduate School Of Information Production And Systems Waseda University
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HUANG Zhangcai
Fukuoka Industry, Science and Technology Foundation
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FANG Shuai
Hitachi-LG Storage, Inc.
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Fang Shuai
Hitachi-lg Storage Inc.
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Tanaka Masakazu
Panasonic Corp.
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FURUKAWA Katsuhiro
Jedat Inc.
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HACHIYA Koutaro
Jedat Inc.
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IBE Tetsuya
Sanyo Electric Co. Ltd.
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OOYA Kazuyuki
SANYO LSI Design・System Soft Co., Ltd.
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TAKASHIMA Yuji
SANYO Semiconductor Co., Ltd.
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Ooya Kazuyuki
Sanyo Lsi Design・system Soft Co. Ltd.
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Takashima Yuji
Sanyo Semiconductor Co. Ltd.
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Huang Zhangcai
Fukuoka Industry Science And Technology Foundation
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Fujii Junko
Starc
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SATO Takashi
Tokyo Institute of Technology
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Pan Jun
Graduate School Of Information Production And Systems Waseda University
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YU Hong
Graduate School of Information, Production and Systems, Waseda University
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INOSHITA Toshinori
STARC
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INAGAKI Ryosuke
STARC
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MAO Junfa
Shanghai Jiao Tong University
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HUANG Zhangcai
The Graduate School of Information, Production and Systems, Waseda University
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KUROKAWA Atsushi
The Semiconductor Technology Academic Research Center (STAC)
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INOUE Yasuaki
The Graduate School of Information, Production and Systems, Waseda University
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Yu Hong
Graduate School Of Information Production And Systems Waseda University
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Masuda Hiroo
Semiconductor Technology Academic Research Center (starc)
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Masuda Hiroo
Semiconductor Technology Academic Research Center
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ONO Nobuto
Jedat Inc.
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KOBAYASHI Hiroyuki
Nihon Synopsys Co., Ltd.
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HACHIYA Koutaro
NEC Electronics Corp.
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Pan Jun
Graduate School Of Agriculture Hokkaido University
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AKUTSU Shigekiyo
Oki Electric Industry Co., Ltd.
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NAKABAYASHI Tamiyo
SHARP Corporation
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ICHINOMIYA Takahiro
Matsushita Electric Industrial Co., Ltd.
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ISHIKAWA Hiroshi
Sequence Design, Inc.
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MUROMOTO Sakae
Cadence Design Systems
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CHANG Wei
Crystal Cosmotech Corp
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KAGE Tetsuro
Tokyo National College of Technology
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ZHAO Wenqing
Micro-Electronics Department, Fudan University
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Inagaki Ryosuke
Graduate School Of Ips Waseda University
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Inagaki Ryosuke
Starc:waseda University
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Yu Hong
Graduate School Of Information Production And System Waseda University
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Akutsu Shigekiyo
Oki Electric Industry Co. Ltd.
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Ichinomiya Takahiro
Matsushita Electric Industrial Co. Ltd.
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FUJITA Hiroshi
SANYO Semiconductor Co., Ltd.
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Ibe Tetsuya
Sanyo Semiconductor Co. Ltd.
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Zhao Wenqing
Micro-electronics Department Fudan University
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Li Qiang
Graduate Student Department Of Civil Engineering Gunma University 1-5-1 Tenjin-cho Kiryu City Gunma
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Fujita Hiroshi
Sanyo Semiconductor Co. Ltd.
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Kobayashi Hiroyuki
Nihon Synopsys Co. Ltd.
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Lin Bin
Graduate School Of Production Information And Systems Waseda University
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Li Qiang
Graduate School Of Production Information And Systems Waseda University
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Ishikawa Hiroshi
Sequence Design Inc.
著作論文
- Accurate Method for Calculating the Effective Capacitance with RC Loads Based on the Thevenin Model
- An advanced effective capacitance model considering input waveform effect (第21回 回路とシステム軽井沢ワークショップ論文集) -- (ばらつき関連技術)
- Determination of Interconnect Structural Parameters for Best-and Worst-Case Delays(Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
- Formula-Based Method for Capacitance Extraction of Interconnects with Dummy Fills(Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
- Modeling the Influence of Input-to-Output Coupling Capacitance on CMOS Inverter Delay(Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
- Calculating the effective capacitance for interconnect loads based on thevenin model (VLSIのノイズ・タイミング解析)
- Second-Order Polynomial Expressions for On-Chip Interconnect Capacitance(Interconnect, VLSI Design and CAD Algorithms)
- Modeling the Effective Capacitance of Interconnect Loads for Predicting CMOS Gate Slew(Prediction and Analysis, VLSI Design and CAD Algorithms)
- A Novel Model for Computing the Effective Capacitance of CMOS Gates with Interconnect Loads(Nonlinear Theory and its Applications)
- Modeling the Effective Capacitance of Interconnect Loads for Predicting CMOS Gate Slew
- Impact of Self-Heating in Wire Interconnection on Timing
- An Approach for Reducing Leakage Current Variation due to Manufacturing Variability
- Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
- Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation(Interconnect,VLSI Design and CAD Algorithms)
- Efficient Dummy Filling Methods to Reduce Interconnect Capacitance and Number of Dummy Metal Fills(Interconnect, VLSI Design and CAD Algorithms)
- A Practical Approach for Efficiently Extracting Interconnect Capacitances with Floating Dummy Fills(VLSI Design Technology and CAD)
- Efficient Large Scale Integration Power/Ground Network Optimization Based on Grid Genetic Algorithm(Power/Ground Network, VLSI Design and CAD Algorithms)
- Practical Redundant-Via Insertion Method Considering Manufacturing Variability and Reliability
- Simple Analytical Formulas for Estimating IR-Drops in an Early Design Stage
- Prevention in a Chip of EMI Noise Caused by X'tal Oscillator
- A Non-Iterative Method for Calculating the Effective Capacitance of CMOS Gates with Interconnect Load Effect