Okumura Takaaki | Semiconductor Technol. Academic Res. Center
スポンサーリンク
概要
関連著者
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Okumura Takaaki
Semiconductor Technol. Academic Res. Center
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Hashimoto Masanori
Osaka Univ.
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SATO Takashi
Kyoto University
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Sakata Tsuyoshi
Fujitsu Microelectronics Ltd.
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Sato T
Photonic Lattice Inc.:niche Tohoku University
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Hashimoto Masanori
Osaka Univ. Suita‐shi Jpn
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Sato Takashi
Institute Of Physics And Tsukuba Research Center For Interdisciplinary Materials Science University
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HASHIMOTO Masanori
Osaka University
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Masuda Hiroo
Renesas Technology Corp.
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OKUMURA Takaaki
Semiconductor Technology Academic Research Center
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NAKASHIMA Hidenari
NEC Electronics Corp.
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Nakashima Hidenari
Integrated Research Institute Tokyo Institute Of Technology
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KANAMOTO Toshiki
Renesas Technology Corporation
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KUROKAWA Atsushi
Sanyo Semiconductor Co. Ltd.
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Masuda Hiroo
Renesas Technol. Corp. Kodaira‐shi Jpn
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TAKAFUJI Hiroshi
RICOH Company Ltd.
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Hachiya Kotaro
Jedat Inc.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd.
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Kanamoto Toshiki
Mirai‐selete Sagamihara‐shi Jpn
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Kanamoto Toshiki
Renesas Technology Corp.
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Kanamoto Toshiki
Renesas Design Corp.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd
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Masuda Hiroo
Renesas Electronics Corporation, Takasaki, Gunma 370-0021, Japan
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SATO Takashi
Tokyo Institute of Technology
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Tanaka Masakazu
Panasonic Corp.
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FURUKAWA Katsuhiro
Jedat Inc.
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HACHIYA Koutaro
Jedat Inc.
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ONO Nobuto
Jedat Inc.
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KOBAYASHI Hiroyuki
Nihon Synopsys Co., Ltd.
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OKUMURA Takaaki
Fujitsu VLSI Ltd.
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Kobayashi Hiroyuki
Nihon Synopsys Co. Ltd.
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Oka Hiroki
Ntt Advanced Technology Corporation:(present Office)nippon Telegraph And Telephone Corporation
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IWAI Jiro
Mathematical Systems Inc.
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HACHIYA Koutaro
NEC Electronics Corp.
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SATO Takashi
Renesas Technology Corporation
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Shimazaki Kenji
Semiconductor Technology Academic Research Center
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MINAMI Fumihiro
Semiconductor Technology Academic Research Center
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KUWADA Kimihiko
Semiconductor Technology Academic Research Center
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Minami Fumihiro
Semiconductor Da Amp Test Engineering Center Toshiba Corporation
著作論文
- Impact of Self-Heating in Wire Interconnection on Timing
- An Approach for Reducing Leakage Current Variation due to Manufacturing Variability
- Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
- Proposal of Metrics for SSTA Accuracy Evaluation(Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa)
- A Method to Derive SSO Design Rule Considering Jitter Constraint(Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
- Gate Delay Estimation in STA under Dynamic Power Supply Noise
- Setup Time, Hold Time and Clock-to-Q Delay Computation under Dynamic Supply Noise