Proposal of Metrics for SSTA Accuracy Evaluation(<Special Section>Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa)

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概要

• 論文の詳細を見る

• With the recent advance of process technology shrinking, process parameter variation has become one of the major issues in SoC designs, especially for timing convergence. Recently, Statistical Static Timing Analysis (SSTA) has been proposed as a promising solution to consider the process parameter variation but it has not been widely used yet. For estimating the delay yield, designers have to know and understand the accuracy of SSTA. However, the accuracy has not been thoroughly studied from a practical point of view. This paper proposes two metrics to measure the pessimism/optimism of SSTA; the first corresponds to yield estimation error, and the second examines delay estimation error. We apply the metrics for a problem which has been widely discussed in SSTA community, that is, normal-distribution approximation of max operation. We also apply the proposed metrics for benchmark circuits and discuss about a potential problem originating from normal-distribution approximation. Our metrics indicate that the appropriateness of the approximation depends on not only given input distributions but also the target yield of the product, which is an important message for SSTA users.

• 社団法人電子情報通信学会の論文
• 2007-04-01

著者

• HASHIMOTO Masanori

  Osaka University

• SATO Takashi

  Kyoto University

• SATO Takashi

  Tokyo Institute of Technology

• Sakata Tsuyoshi

  Fujitsu Microelectronics Ltd.

• Sato T

  Photonic Lattice Inc.:niche Tohoku University

• Masuda Hiroo

  Renesas Technology Corp.

• NAKASHIMA Hidenari

  NEC Electronics Corp.

• ONO Nobuto

  Jedat Inc.

• KOBAYASHI Hiroyuki

  Nihon Synopsys Co., Ltd.

• IWAI Jiro

  Mathematical Systems Inc.

• OKUMURA Takaaki

  Fujitsu VLSI Ltd.

• Hashimoto Masanori

  Osaka Univ. Suita‐shi Jpn

• Nakashima Hidenari

  Integrated Research Institute Tokyo Institute Of Technology

• Kobayashi Hiroyuki

  Nihon Synopsys Co. Ltd.

• Sato Takashi

  Institute Of Physics And Tsukuba Research Center For Interdisciplinary Materials Science University

• Hashimoto Masanori

  Osaka Univ.

• Okumura Takaaki

  Semiconductor Technol. Academic Res. Center

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