Evaluation of X Architecture Using Interconnect Length Distribution(Interconnect, <Special Section>VLSI Design and CAD Algorithms)

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概要

• 論文の詳細を見る

• In this paper, we propose a new Interconnect Length Distribution (ILD) model to evaluate X architecture. X architecture uses 45°-wire orientations in addition to 90°-wire orientations, which contributes to reduce the total wire length and the number of vias. In this paper, we evaluated interconnect length distribution of diagonal (45° orientations) and all-directional wiring. The average length and the longest length of interconnect are estimated, and 18% reduction in power consumption and 17% improvement in clock frequency can be obtained by the diagonal wiring in the experimental results. The all-directional wiring does not have large advantage as compared the diagonal wiring.

• 社団法人電子情報通信学会の論文
• 2005-12-01

著者

• Masu Kazuya

  Integrated Research Institute

• Okada Kenichi

  Integrated Research Institute Tokyo Institute Of Technology

• NAKASHIMA Hidenari

  NEC Electronics Corp.

• INOUE Junpei

  Integrated Research Institute Laboratory, Tokyo Institute of Technology

• NAKASHIMA Hidenari

  Integrated Research Institute Laboratory, Tokyo Institute of Technology

• TAKAGI Naohiro

  Integrated Research Institute, Tokyo Institute of Technology

• Takagi Naohiro

  Integrated Research Institute Tokyo Institute Of Technology

• Inoue Junpei

  Integrated Research Institute Tokyo Institute Of Technology

• Nakashima Hidenari

  Integrated Research Institute Tokyo Institute Of Technology

• Masu Kazuya

  Solutions Research Laboratory Tokyo Institute Of Technology

• Okada Kenichi

  Tokyo Inst. Of Technol. Yokohama‐shi Jpn

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