Circuit Performance Prediction Considering Core Utilization with Interconnect Length Distribution Model(Prediction and Analysis, <Special Section>VLSI Design and CAD Algorithms)
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概要
- 論文の詳細を見る
Interconnect Length Distribution (ILD) represents the correlation between the number of interconnects and their length. The ILD can predict power consumption, clock frequency, chip size, etc. High core utilization and small circuit area have been reported to improve chip performance. We propose an ILD model to predict the correlation between core utilization and chip performance. The proposed model predicts the influences of interconnect length and interconnect density on circuit performances. As core utilization increases, small and simple circuits improve the performances. In large complex circuits, decreasing the wire coupling capacitance is more important than decreasing the total interconnect length for improvement of chip performance. The proposed ILD model expresses the actual ILD more accurately than conventional models.
- 社団法人電子情報通信学会の論文
- 2005-12-01
著者
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Masu Kazuya
Integrated Research Institute
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Okada Kenichi
Integrated Research Institute Tokyo Institute Of Technology
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NAKASHIMA Hidenari
NEC Electronics Corp.
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INOUE Junpei
Integrated Research Institute Laboratory, Tokyo Institute of Technology
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NAKASHIMA Hidenari
Integrated Research Institute Laboratory, Tokyo Institute of Technology
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Inoue Junpei
Integrated Research Institute Tokyo Institute Of Technology
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Nakashima Hidenari
Integrated Research Institute Tokyo Institute Of Technology
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Masu Kazuya
Solutions Research Laboratory Tokyo Institute Of Technology
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Okada Kenichi
Tokyo Inst. Of Technol. Yokohama‐shi Jpn
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