A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation
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概要
- 論文の詳細を見る
A time-slicing ring oscillator (TSRO) which captures time-dependent delay degradation due to periodic transient voltage drop on a power supply network is proposed. An impact of the supply voltage fluctuations, including voltage drop and overshoot, on logic circuit delay is evaluated as a change of oscillation frequency. The TSRO is designed using standard logic cells so that it can be placed almost anywhere in a digital circuit wherein supply voltage fluctuation is concerned. We also propose a new procedure for reconstructing supply voltage waveform. The procedure enables us to accurately monitor time-dependent, effective supply voltages. The −1dB bandwidth of the TSRO is simulated to be 15.7GHz, and measured time resolution is 131ps. Measurement results of a test chip using 90-nm standard CMOS process successfully proved the feasibility of both delay degradation and effective supply voltage fluctuation measurements. Measurement of spatial voltage drop fluctuation is achieved.
- （社）電子情報通信学会の論文
- 2010-03-01
著者
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Masu Kazuya
Integrated Research Institute
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Masu Kazuya
東工大
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UEZONO Takumi
Integrated Research Institute, Tokyo Institute of Technology
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SATO Takashi
Graduate School of Informatics, Kyoto University
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Uezono Takumi
Integrated Research Institute Tokyo Institute Of Technology
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Sato Takashi
Graduate School Of Informatics Kyoto University
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Masu Kazuya
Solutions Research Laboratory Tokyo Institute Of Technology
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