An Approach for Reducing Leakage Current Variation due to Manufacturing Variability

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概要

• 論文の詳細を見る

• Leakage current is an important qualitative metric of LSI (Large Scale Integrated circuit). In this paper, we focus on reduction of leakage current variation under the process variation. Firstly, we derive a set of quadratic equations to evaluate delay and leakage current under the process variation. Using these equations, we discuss the cases of varying leakage current without degrading delay distribution and propose a procedure to reduce the leakage current variations. From the experiments, we show the proposed method effectively reduces the leakage current variation up to 50% at 90 percentile point of the distribution compared with the conventional design approach.

• （社）電子情報通信学会の論文
• 2009-12-01

著者

• KANAMOTO Toshiki

  Renesas Technology Corporation

• HASHIMOTO Masanori

  Osaka University

• SATO Takashi

  Kyoto University

• Sakata Tsuyoshi

  Fujitsu Microelectronics Ltd.

• KUROKAWA Atsushi

  Sanyo Semiconductor Co. Ltd.

• Tanaka Masakazu

  Panasonic Corp.

• Sato T

  Photonic Lattice Inc.:niche Tohoku University

• Masuda Hiroo

  Renesas Technol. Corp. Kodaira‐shi Jpn

• Masuda Hiroo

  Renesas Technology Corp.

• OKUMURA Takaaki

  Semiconductor Technology Academic Research Center

• FURUKAWA Katsuhiro

  Jedat Inc.

• TAKAFUJI Hiroshi

  RICOH Company Ltd.

• HACHIYA Koutaro

  Jedat Inc.

• NAKASHIMA Hidenari

  NEC Electronics Corp.

• Hachiya Kotaro

  Jedat Inc.

• Kurokawa Atsushi

  Sanyo Electric Co. Ltd.

• Hashimoto Masanori

  Osaka Univ. Suita‐shi Jpn

• Kanamoto Toshiki

  Mirai‐selete Sagamihara‐shi Jpn

• Kanamoto Toshiki

  Renesas Technology Corp.

• Kanamoto Toshiki

  Renesas Design Corp.

• Nakashima Hidenari

  Integrated Research Institute Tokyo Institute Of Technology

• Kurokawa Atsushi

  Sanyo Electric Co. Ltd

• Sato Takashi

  Institute Of Physics And Tsukuba Research Center For Interdisciplinary Materials Science University

• Hashimoto Masanori

  Osaka Univ.

• Okumura Takaaki

  Semiconductor Technol. Academic Res. Center

• Masuda Hiroo

  Renesas Electronics Corporation, Takasaki, Gunma 370-0021, Japan

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