Kanamoto Toshiki | Renesas Technology Corp.
スポンサーリンク
概要
関連著者
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Kanamoto Toshiki
Renesas Technology Corp.
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Kanamoto Toshiki
Renesas Design Corp.
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KANAMOTO Toshiki
Renesas Technology Corporation
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Kanamoto Toshiki
Mirai‐selete Sagamihara‐shi Jpn
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Masuda Hiroo
Renesas Technology Corp.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd
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HASHIMOTO Masanori
Osaka University
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Hashimoto Masanori
Osaka Univ. Suita‐shi Jpn
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Hashimoto Masanori
Osaka Univ.
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SATO Takashi
Kyoto University
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Sakata Tsuyoshi
Fujitsu Microelectronics Ltd.
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KUROKAWA Atsushi
Sanyo Semiconductor Co. Ltd.
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KUROKAWA Atsushi
STARC
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KASEBE Akira
Meitec Corp.
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Sato T
Photonic Lattice Inc.:niche Tohoku University
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Masuda Hiroo
Renesas Technol. Corp. Kodaira‐shi Jpn
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OKUMURA Takaaki
Semiconductor Technology Academic Research Center
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TAKAFUJI Hiroshi
RICOH Company Ltd.
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NAKASHIMA Hidenari
NEC Electronics Corp.
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Hachiya Kotaro
Jedat Inc.
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Inoue Yasuaki
Graduate School Of Ips Waseda University
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Nakashima Hidenari
Integrated Research Institute Tokyo Institute Of Technology
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Sato Takashi
Institute Of Physics And Tsukuba Research Center For Interdisciplinary Materials Science University
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Okumura Takaaki
Semiconductor Technol. Academic Res. Center
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Masuda Hiroo
Renesas Electronics Corporation, Takasaki, Gunma 370-0021, Japan
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Terai Masayuki
Faculty Of Informatics Osaka Gakuin University
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SHIROTA Mitsutoshi
Renesas Technology Corp.
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WATANABE Tetsuya
Renesas Technology Corp
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MASUDA Hiroo
STARC
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INOUE Yasuaki
Waseda University
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Tanaka Masakazu
Panasonic Corp.
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FURUKAWA Katsuhiro
Jedat Inc.
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HACHIYA Koutaro
Jedat Inc.
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SATO Takashi
Tokyo Institute of Technology
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ISHIKAWA Kiyoshi
Renesas Technology Corporation
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INOUE Yasuaki
Graduate School of Information, Production and Systems, Waseda University
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Yang Yun
Waseda Univ. Kitakyushu‐shi Jpn
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OMURA Masahiko
Renesas Technology Corp.
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TSUKAMOTO Michiko
Renesas Technology Corp.
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NAKAJIMA Takashi
Renesas Technology Corp.
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TERAI Masayuki
Osaka Gakuin University
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KUNIKIYO Tatsuya
Renesas Technology Corp
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AJIOKA Yoshihide
Renesas Technology Corp
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HORIBA Yasutaka
Kansai University
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Huang Zhangcai
Research Center Of Information Production And Systems Waseda University
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HUANG Zhangcai
Waseda University
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KUROKAWA Atsushi
Semiconductor Technology Academic Research Center (STARC)
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Huang Zhangcai
Waseda Univ. Kitakyushu‐shi Jpn
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Masuda Hiroo
Semiconductor Technology Academic Research Center (starc)
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Masuda Hiroo
Semiconductor Technology Academic Research Center
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Inoue Yasuaki
Graduate School Of Information Production And Systems Waseda University
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Terai Masayuki
Osaka Gakuin Univ. Suita‐shi Jpn
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Ishikawa Kiyoshi
Renesas Technol. Corp. Itami‐shi Jpn
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ONO Nobuto
Jedat Inc.
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KOBAYASHI Hiroyuki
Nihon Synopsys Co., Ltd.
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HACHIYA Koutaro
NEC Electronics Corp.
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AKUTSU Shigekiyo
Oki Electric Industry Co., Ltd.
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NAKABAYASHI Tamiyo
SHARP Corporation
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ICHINOMIYA Takahiro
Matsushita Electric Industrial Co., Ltd.
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ISHIKAWA Hiroshi
Sequence Design, Inc.
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MUROMOTO Sakae
Cadence Design Systems
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IBE Tetsuya
Sanyo Electric Co. Ltd.
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CHANG Wei
Crystal Cosmotech Corp
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KAGE Tetsuro
Tokyo National College of Technology
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Akutsu Shigekiyo
Oki Electric Industry Co. Ltd.
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Kunikiyo Tatsuya
Mirai‐selete Sagamihara‐shi Jpn
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Amishiro Hiroyuki
Renesas Technology Corp.
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Ichinomiya Takahiro
Matsushita Electric Industrial Co. Ltd.
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OGASAHARA Yasuhiro
Osaka University
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NATSUME Keiko
Renesas Technology Corp.
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YAMAGUCHI Kenji
Renesas Technology Corp.
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Kobayashi Hiroyuki
Nihon Synopsys Co. Ltd.
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Watanabe Tetsuya
Renesas Technology Corp.
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Ishikawa Hiroshi
Sequence Design Inc.
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Ogasahara Yasuhiro
Osaka Univ. Suita‐shi Jpn
著作論文
- A Fast Characterizing Method for Large Embedded Memory Modules on SoC(Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa)
- A Method of Precise Estimation of Physical Parameters in LSI Interconnect Structures(Interconnect, VLSI Design and CAD Algorithms)
- Formula-Based Method for Capacitance Extraction of Interconnects with Dummy Fills(Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
- Impact of Self-Heating in Wire Interconnection on Timing
- An Approach for Reducing Leakage Current Variation due to Manufacturing Variability
- Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
- Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation(Interconnect,VLSI Design and CAD Algorithms)
- Efficient Dummy Filling Methods to Reduce Interconnect Capacitance and Number of Dummy Metal Fills(Interconnect, VLSI Design and CAD Algorithms)
- A Practical Approach for Efficiently Extracting Interconnect Capacitances with Floating Dummy Fills(VLSI Design Technology and CAD)
- Impact of Well Edge Proximity Effect on Timing