KUROKAWA Atsushi | STARC
スポンサーリンク
概要
関連著者
-
KUROKAWA Atsushi
STARC
-
Masuda Hiroo
Renesas Technology Corp.
-
Kurokawa Atsushi
Sanyo Electric Co. Ltd.
-
Kurokawa Atsushi
Sanyo Electric Co. Ltd
-
MASUDA Hiroo
STARC
-
KASEBE Akira
Meitec Corp.
-
Inoue Yasuaki
Graduate School Of Ips Waseda University
-
KANAMOTO Toshiki
Renesas Technology Corporation
-
Huang Zhangcai
Research Center Of Information Production And Systems Waseda University
-
HUANG Zhangcai
Waseda University
-
INOUE Yasuaki
Waseda University
-
Huang Zhangcai
Waseda Univ. Kitakyushu‐shi Jpn
-
Kanamoto Toshiki
Mirai‐selete Sagamihara‐shi Jpn
-
Kanamoto Toshiki
Renesas Technology Corp.
-
Kanamoto Toshiki
Renesas Design Corp.
-
HASHIMOTO Masanori
Osaka University
-
Yang Yun
Waseda Univ. Kitakyushu‐shi Jpn
-
Hashimoto Masanori
Osaka Univ. Suita‐shi Jpn
-
Hashimoto Masanori
Osaka Univ.
-
Fujii Junko
Starc
-
INOUE Yasuaki
Graduate School of Information, Production and Systems, Waseda University
-
INOSHITA Toshinori
STARC
-
INAGAKI Ryosuke
STARC
-
Inoue Yasuaki
Graduate School Of Information Production And Systems Waseda University
-
KOBAYASHI Hiroyuki
Nihon Synopsys Co., Ltd.
-
HACHIYA Koutaro
NEC Electronics Corp.
-
Hachiya Kotaro
Jedat Inc.
-
AKUTSU Shigekiyo
Oki Electric Industry Co., Ltd.
-
NAKABAYASHI Tamiyo
SHARP Corporation
-
ICHINOMIYA Takahiro
Matsushita Electric Industrial Co., Ltd.
-
ISHIKAWA Hiroshi
Sequence Design, Inc.
-
MUROMOTO Sakae
Cadence Design Systems
-
IBE Tetsuya
Sanyo Electric Co. Ltd.
-
CHANG Wei
Crystal Cosmotech Corp
-
KAGE Tetsuro
Tokyo National College of Technology
-
Inagaki Ryosuke
Graduate School Of Ips Waseda University
-
Inagaki Ryosuke
Starc:waseda University
-
Akutsu Shigekiyo
Oki Electric Industry Co. Ltd.
-
Ichinomiya Takahiro
Matsushita Electric Industrial Co. Ltd.
-
Kobayashi Hiroyuki
Nihon Synopsys Co. Ltd.
-
Ishikawa Hiroshi
Sequence Design Inc.
著作論文
- Determination of Interconnect Structural Parameters for Best-and Worst-Case Delays(Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
- Formula-Based Method for Capacitance Extraction of Interconnects with Dummy Fills(Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
- Second-Order Polynomial Expressions for On-Chip Interconnect Capacitance(Interconnect, VLSI Design and CAD Algorithms)
- Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation(Interconnect,VLSI Design and CAD Algorithms)
- Efficient Dummy Filling Methods to Reduce Interconnect Capacitance and Number of Dummy Metal Fills(Interconnect, VLSI Design and CAD Algorithms)