SATO Takashi | Tokyo Institute of Technology
スポンサーリンク
概要
関連著者
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SATO Takashi
Tokyo Institute of Technology
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HASHIMOTO Masanori
Osaka University
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SATO Takashi
Kyoto University
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Sakata Tsuyoshi
Fujitsu Microelectronics Ltd.
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Sato T
Photonic Lattice Inc.:niche Tohoku University
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Masuda Hiroo
Renesas Technology Corp.
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NAKASHIMA Hidenari
NEC Electronics Corp.
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ONO Nobuto
Jedat Inc.
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Hashimoto Masanori
Osaka Univ. Suita‐shi Jpn
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Nakashima Hidenari
Integrated Research Institute Tokyo Institute Of Technology
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Sato Takashi
Institute Of Physics And Tsukuba Research Center For Interdisciplinary Materials Science University
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Hashimoto Masanori
Osaka Univ.
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Okumura Takaaki
Semiconductor Technol. Academic Res. Center
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KANAMOTO Toshiki
Renesas Technology Corporation
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Masu K
Research Institute Of Electrical Communication Tohoku University
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Masu Kazuya
Integrated Research Institute
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Masu Kazuya
Tokyo Institute Of Technology
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Amakawa Shuhei
Tokyo Inst. Of Technol. Yokohama‐shi Jpn
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Amakawa Shuhei
Integrated Research Institute Tokyo Institute Of Technology
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YAMADA Kenta
NEC Electronics Corporation
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NAKAYAMA Noriaki
Tokyo Institute of Technology
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KUMASHIRO Shigetaka
MIRAI-Selete
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Tanoi Satoru
東工大
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Masu Kazuya
東工大
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Yamada Kenta
Nec Electronics Corp. Kawasaki‐shi Jpn
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Masu Kazuya
Tokyo Inst. Of Technol. Yokohama‐shi Jpn
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SATO Takashi
Graduate School of Informatics, Kyoto University
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NAKAYAMA Noriaki
Institute for Chemical Research,Kyoto University
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Nakayama Noriaki
Semiconductor Technology Academic Research Center
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KUROKAWA Atsushi
Sanyo Semiconductor Co. Ltd.
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Masuda Hiroo
Renesas Technol. Corp. Kodaira‐shi Jpn
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Sato Takashi
Graduate School Of Informatics Kyoto University
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OKUMURA Takaaki
Semiconductor Technology Academic Research Center
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TAKAFUJI Hiroshi
RICOH Company Ltd.
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KOBAYASHI Hiroyuki
Nihon Synopsys Co., Ltd.
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IWAI Jiro
Mathematical Systems Inc.
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OKUMURA Takaaki
Fujitsu VLSI Ltd.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd.
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Kanamoto Toshiki
Mirai‐selete Sagamihara‐shi Jpn
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Kanamoto Toshiki
Renesas Technology Corp.
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Kanamoto Toshiki
Renesas Design Corp.
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Masu Kazuya
Solutions Research Laboratory Tokyo Institute Of Technology
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Kobayashi Hiroyuki
Nihon Synopsys Co. Ltd.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd
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Masuda Hiroo
Renesas Electronics Corporation, Takasaki, Gunma 370-0021, Japan
著作論文
- Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress
- Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
- Proposal of Metrics for SSTA Accuracy Evaluation(Selected Papers from the 19th Workshop on Circuits and Systems in Karuizawa)