Prevention in a Chip of EMI Noise Caused by X'tal Oscillator
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概要
- 論文の詳細を見る
Developing LSIs with EMI suppression, particularly for use in automobiles, is important for improving warranties and customer acquisition. First, we describe that the measures against EMI noise caused by a Xtal oscillator are important. Next, we present a practical method for analyzing the noise with models of the inside and outside of a chip. In addition, we propose a within-chip measure against EMI noise that takes chip cost into account. The noise is suppressed by using an appropriate resistance and capacitance on the power line. Simulation results demonstrated the methods effectiveness in suppressing noise.
- （社）電子情報通信学会の論文
- 2008-04-01
著者
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KUROKAWA Atsushi
Sanyo Semiconductor Co. Ltd.
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IBE Tetsuya
Sanyo Electric Co. Ltd.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd.
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FUJITA Hiroshi
SANYO Semiconductor Co., Ltd.
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Ibe Tetsuya
Sanyo Semiconductor Co. Ltd.
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Fujita Hiroshi
Sanyo Semiconductor Co. Ltd.
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Kurokawa Atsushi
Sanyo Electric Co. Ltd
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