Minami Fumihiro | Semiconductor Da Amp Test Engineering Center Toshiba Corporation
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概要
関連著者
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Minami Fumihiro
Semiconductor Da Amp Test Engineering Center Toshiba Corporation
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KOJIMA Naohito
Semiconductor DA & Test Center, TOSHIBA CORPORATION
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Kojima Naohito
Semiconductor Da Amp Test Engineering Center Toshiba Corporation
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OKUMURA Takaaki
Semiconductor Technology Academic Research Center
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Hashimoto Masanori
Osaka Univ. Suita‐shi Jpn
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Shimazaki Kenji
Semiconductor Technology Academic Research Center
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MINAMI Fumihiro
Semiconductor Technology Academic Research Center
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KUWADA Kimihiko
Semiconductor Technology Academic Research Center
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Takano Midori
Semiconductor Da Amp Test Engineering Center Toshiba Corporation
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Hashimoto Masanori
Osaka Univ.
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Okumura Takaaki
Semiconductor Technol. Academic Res. Center
著作論文
- Gate Delay Estimation in STA under Dynamic Power Supply Noise
- Delay and Skew Minimized Clock Tree Synthesis for Embedded Arrays (Special Issue on Synthesis and Verification of Hardware Design)