Observation of Lattice Undulation of Commercial Bonded Silicon-On-Insulator Wafers by Synchrotron X-Ray Topography : Structure and Mechanical and Thermal Properties of Condensed Matter

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2002-11-15

著者

• FUKUDA Kazunori

  Department of Oriental Medicine, Gifu University School of Medicine

• YASUTAKE Kiyoshi

  Department of Precision Engineering, Faculty of Engineering, Osaka University

• UMENO Masataka

  Department of Precision Engineering, Faculty of Engineering, Osaka University

• Yasutake Kiyoshi

  Graduate School Of Engineering Osaka University

• Yasutake K

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

• Yasutake Kiyoshi

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

• SHIMURA Takayoshi

  Department of Material and Life Science, Graduate School of Engineering, Osaka University

• Umeno Masataka

  Department Of Management And Information Science Faculty Of Engineering Fukui University Of Technolo

• Umeno Masataka

  Department Of Applied Physics Faculty Of Engineering Osaka University

• Fukuda Kazunori

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

• Yoshida Takayoshi

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

• Yoshida Takayoshi

  Department Of Health And Sport Sciences Graduate School Of Medicine Osaka University

• Shimura Takayoshi

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

• Yoshida Takayoshi

  Department Of Heaith And Sports Sciences Osaka University

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