The annealing effects of GaN MIS capacitors with photo-CVD oxide layers
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概要
- 論文の詳細を見る
- 2005-09-13
著者
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Su Y‐k
National Cheng Kung Univ. Tainan Twn
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Chiou Y‐z
Department Of Electronics Engineering Southern Taiwan University Of Technology
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Wang Chun-kai
Department Of Electrical Engineering National Cheng-kung University
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CHIOU Yu-Zung
Department of Electronics Engineering Southern Taiwan University of Technology
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TANG Jing-Jou
Department of Electronics Engineering Southern Taiwan University of Technology
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Su Yan-kuin
Department Of Electrical Engineering National Cheng-kung University
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Su Yan-kuin
Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
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CHANG Shoou-Jinn
Department of Electrical Engineering, National Cheng Kung University
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Chang S‐j
Department Of Electrical Engineering National Cheng-kung University
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Chiou Yu-zung
Department Of Electrical Engineering National Cheng Kung University
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Chang Shoou-jinn
Department Of Electrical Engineering National Cheng Kung University
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Cherng Y‐t
Chung‐shan Inst. Sci. And Technol. Tao‐yuan Twn
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