Deep Traps and Mechanism of Brightness Degradation in Mn-doped ZnS Thin-Film Electroluminescent Devices Grown by Metal-Organic Chemical Vapor Deposition

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1997-05-15

著者

• Su Yan-kuin

  Department Of Electrical Engineering National Cheng-kung University

• Yokoyama Meiso

  Department of Electrical Engineering, National Cheng Kung University

• Su Yan-kuin

  Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

• Wang Ching-wu

  Department Of Electronic Engineering Kaohsiung Polytechnic Institute

• Yokoyama Meiso

  Department Of Electrical Engineering National Cheng Kung University

• SHEU Tong-Ji

  Department of Electronic Engineering, Kaohsiung Polytechnic Institute

• Sheu Tong-ji

  Department Of Electronic Engineering Kaohsiung Polytechnic Institute

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