Evaluation of Electronic Defect States at Poly-Si/HfO_2 interface by Photoelectron Yield Spectroscopy

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概要

• 論文の詳細を見る
• 2004-09-15

著者

• MIYAZAKI Seiichi

  Hiroshima University

• Miyazaki Seiichi

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• HIGASHI Seiichiro

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• OHTA Akio

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• Ohta Akiko

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• NAKAGAWA Hiroshi

  Graduate School of Information Sciences, Hiroshima City University

• Ohta Akio

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Miyazaki Seiichi

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Miyazaki Seiichi

  Hiroshima Univ.

• SHIBAGUCHI Taku

  Graduate School of Advanced Sciences and Matters, Hiroshima University

• SUGIMURA Masashi

  Graduate School of Advanced Sciences of Matter, Hiroshima University

• Sugimura Masashi

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Miyazaki Seiichi

  Graduate School Of Advanced Sciences And Matters Hiroshima University

• Higashi Seiichiro

  Department Of Semiconductor Electronics And Integration Science Graduate School Of Advanced Sciences

• Shibaguchi Taku

  Graduate School Of Advanced Sciences And Matters Hiroshima University

• Shibaguchi Taku

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Higashi Seiichiro

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Miyazaki Seiichi

  Graduate School Of Engineering Nagoya University

• Nakagawa Hiroshi

  Graduate School Of Information Sciences Hiroshima City University

• Nakagawa Hiroshi

  Graduate School Of Advanced Sciences Of Matter Hiroshima University

• Higashi Seiichiro

  Graduate School of Advanced Science of Matter, Hiroshima University, Higashihiroshima, Hiroshima 739-8530, Japan

• Miyazaki Seiichi

  Graduate School of Advanced Science and Matter, Hiroshima University, Higashihiroshima, Hiroshima 739-8530, Japan

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