Ohta Akio | Graduate School Of Advanced Sciences Of Matter Hiroshima University

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Characterization of Mg Diffusion into HfO_2/SiO_2/Si(100) Stacked Structures and Its Impact on Detect State Densities(Session 7A : Gate Oxides)
The Impact of H_2 Anneal on Resistive Switching in Pt/TiO_2/Pt Structure(Session 2A : Memory 1)
Characterization of Mg Diffusion into HfO_2/SiO_2/Si(100) Stacked Structures and Its Impact on Detect State Densities(Session 7A : Gate Oxides)
The Impact of H_2 Anneal on Resistive Switching in Pt/TiO_2/Pt Structure(Session 2A : Memory 1)
Evaluation of Electronic Defect States at Poly-Si/HfO_2 interface by Photoelectron Yield Spectroscopy
Contribution of Carbon to Growth of Boron-Containing Cluster in Heavily Boron-Doped Silicon
Evaluation of chemical structure and resistance switching characteristics of undoped titanium oxide and titanium-yttrium mixed oxide (Special issue: Dielectric thin films for future electron devices: science and technology)
Impact of Annealing Ambience on Resistive Switching on Pt/TiO_2/Pt Structure
Characterization of Mg Diffusion into HfO_2/SiO_2/Si(100) Stacked Structures and Its Impact on Detect State Densities
Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering
Performance Improvement of HfAlOxN n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors by Controlling the Bonding Configuration of Nitrogen Atoms Coordinated to Hf Atoms
Evaluation of Chemical Composition and Bonding Features of Pt/SiOx/Pt MIM Diodes and Its Impact on Resistance Switching Behavior
Control of Interfacial Reaction of HfO2/Ge Structure by Insertion of Ta Oxide Layer
X-Ray Photoemission Study of SiO2/Si/Si0.55Ge0.45/Si Heterostructures
Characterization of Resistive Switching of Pt/Si-Rich Oxide/TiN System
Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering

もっと見る

スポンサーリンク