OHTA Akio | Graduate School of Advanced Sciences of Matter, Hiroshima University
スポンサーリンク
概要
関連著者
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HIGASHI Seiichiro
Graduate School of Advanced Sciences of Matter, Hiroshima University
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OHTA Akio
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Ohta Akio
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Miyazaki Seiichi
Graduate School Of Advanced Sciences And Matters Hiroshima University
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Higashi Seiichiro
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Higashi Seiichiro
Graduate School of Advanced Science of Matter, Hiroshima University, Higashihiroshima, Hiroshima 739-8530, Japan
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Miyazaki Seiichi
Graduate School of Advanced Science and Matter, Hiroshima University, Higashihiroshima, Hiroshima 739-8530, Japan
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MURAKAMI Hideki
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Miyazaki Seiichi
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Miyazaki Seiichi
Hiroshima Univ.
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Murakami Hideki
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Murakami Hideki
Graduate School Of Advanced Sciences And Matters Hiroshima University
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Higashi Seiichiro
Department Of Semiconductor Electronics And Integration Science Graduate School Of Advanced Sciences
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Miyazaki Seiichi
Graduate School Of Engineering Nagoya University
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Miyazaki Seiichi
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Ohta Akiko
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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MIYAZAKI Seiichi
Hiroshima University
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GOTO Yuta
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Goto Yuta
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Wei Guobin
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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MAKIHARA Katsunori
Hiroshima University
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Kanme Daisuke
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Makihara Katsunori
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Murakami Hideki
Department Of Semiconductor Electronics And Integration Science Graduate School Of Advanced Sciences
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Makihara Katsuonri
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Makihara Katsunori
Graduate School of Advanced Science and Matter, Hiroshima University, Higashihiroshima, Hiroshima 739-8530, Japan
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Makihara Katsunori
Graduate School of Advanced Sciences of Matter, Hiroshima University
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WEI Guobin
Graduate School of Advanced Sciences of Matter, Hiroshima University
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OHTA Akiko
Graduate School of Advanced Sciences of Matter, Hiroshima University
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KANME Daisuke
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Makihara Katsunori
Hiroshima Univ. Higashihiroshima‐shi Jpn
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NAKAGAWA Hiroshi
Graduate School of Information Sciences, Hiroshima City University
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SHIBAGUCHI Taku
Graduate School of Advanced Sciences and Matters, Hiroshima University
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SUGIMURA Masashi
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Sugimura Masashi
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Shibaguchi Taku
Graduate School Of Advanced Sciences And Matters Hiroshima University
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Shibaguchi Taku
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Nakagawa Hiroshi
Graduate School Of Information Sciences Hiroshima City University
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Nakagawa Hiroshi
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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NISHIGAKI Shingo
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Nishigaki Shingo
Graduate School Of Advanced Sciences Of Matter Hiroshima University
著作論文
- Characterization of Mg Diffusion into HfO_2/SiO_2/Si(100) Stacked Structures and Its Impact on Detect State Densities(Session 7A : Gate Oxides)
- The Impact of H_2 Anneal on Resistive Switching in Pt/TiO_2/Pt Structure(Session 2A : Memory 1)
- Characterization of Mg Diffusion into HfO_2/SiO_2/Si(100) Stacked Structures and Its Impact on Detect State Densities(Session 7A : Gate Oxides)
- The Impact of H_2 Anneal on Resistive Switching in Pt/TiO_2/Pt Structure(Session 2A : Memory 1)
- Evaluation of Electronic Defect States at Poly-Si/HfO_2 interface by Photoelectron Yield Spectroscopy
- Impact of Annealing Ambience on Resistive Switching on Pt/TiO_2/Pt Structure
- Characterization of Mg Diffusion into HfO_2/SiO_2/Si(100) Stacked Structures and Its Impact on Detect State Densities
- Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering