Effect of Oxide Breakdown on Complementary Metal Oxide Semiconductor Circuit Operation and Reliability

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2004-11-30

著者

• TANIGUCHI Kenji

  Department of Cancer Research, Fuji Gotemba Research Laboratories, Chugai and Pharmaceutical Co

• Morikawa Shuichi

  Department of Cardiology Kyoto National Hospital

• Kamakura Y

  Department Of Electronics And Information Systems Osaka University

• Kamakura Yoshinari

  Department Of Electronics And Information Systems Osaka University

• Kamakura Yoshinari

  Department Of Electronic Information And Energy Engineering Graduate School Of Eng. Osaka University

• Morikawa Shuichi

  Department Of Electronics And Information Systems Osaka University

• HOSOI Takuji

  Department of Electronics and Information Systems, Osaka University

• Hosoi Takuji

  Department Of Electronics And Information Systems Osaka University

• Taniguchi Kenji

  Department Of Electronics And Information Systems Osaka University

• Taniguchi K

  Kyushu Univ.

• Taniguchi Kenji

  Department Of Biotechnology Tottori University

• Kamakura Yoshinari

  Department of Electronic Engineering, Osaka University, Suita, Osaka 565-0871, Japan

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