Kamakura Yoshinari | Department Of Electronics And Information Systems Osaka University
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概要
- KAMAKURA Yoshinariの詳細を見る
- 同名の論文著者
- Department Of Electronics And Information Systems Osaka Universityの論文著者
関連著者
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TANIGUCHI Kenji
Department of Cancer Research, Fuji Gotemba Research Laboratories, Chugai and Pharmaceutical Co
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Kamakura Yoshinari
Department Of Electronics And Information Systems Osaka University
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Kamakura Yoshinari
Department Of Electronic Information And Energy Engineering Graduate School Of Eng. Osaka University
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Taniguchi Kenji
Department Of Biotechnology Tottori University
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Kamakura Yoshinari
Department of Electronic Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Kamakura Y
Department Of Electronics And Information Systems Osaka University
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Aoki T
Research Institute Of Electronics Shizuoka University
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Aoki Toru
Research Institute Of Electronics Shizuoka University
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Taniguchi K
Department Of Electronic Information And Energy Engineering Graduate School Of Eng. Osaka University
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SAITO Tomoya
Department of Tropical Medicine and Parasitology, School of Medicine, Keio University
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Aoki T
Department Of Electrical Engineering And Electronics College Of Engineering Osaka Sangyo University
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XIA Jianxin
Department of Electronics and Information Systems, Osaka University
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AOKI Takenori
Department of Electronics and Information Systems, Osaka University
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Xia Jianxin
Department Of Electronics And Information Systems Osaka University
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Xia Jianxin
Department Of Dermatology Graduate School Of Medical Sciences Kyushu University
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Aoki T
Department Of Electronics And Information Systems Osaka University
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UNO Shigeyasu
Department of Electronic, Information and Energy Engineering, Graduate School of Eng., Osaka Univers
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Saito T
Process And Manufacturing Engineering Center Semiconductor Company Toshiba Corp.
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Aoki T
Jamstec
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Saito Tomoya
Department Of Communication Engieering Okayama Prefectural University
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Uno Shigeyasu
Department Of Electronic Information And Energy Engineering Graduate School Of Eng. Osaka University
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Uno Shigeyasu
Department Of Electrical Engineering And Computer Science Graduate School Of Engineering Nagoya Univ
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Saito T
School Of Engineering Nagoya University
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Uno Shigeyasu
Department of Electrical and Computer Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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KIM Ryangsu
Department of Electronics and Information Systems, Osaka University
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HOSOI Takuji
Department of Electronics and Information Systems, Osaka University
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DEGUCHI Kazuaki
Department of Electronics and Information Systems, Osaka University
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Hosoi Takuji
Department Of Electronics And Information Systems Osaka University
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Taniguchi Kenji
Department Of Electronics And Information Systems Osaka University
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Taniguchi K
Kyushu Univ.
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Kim R
Osaka Univ. Osaka Jpn
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Kim Ryangsu
Department Of Electronics And Information Systems Osaka University
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Deguchi K
Department Of Electronics And Information Systems Osaka University
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Sakamoto Takuya
Department Of Communications And Computer Engineering Graduate School Of Informatics Kyoto Universit
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ISHIDA Akihiro
Department of Electrical and Electronic Engineering, Shizuoka University
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ITO Toshimichi
Department of Electrical Engineering, Faculty of Engineering, Osaka University
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SAKAI Atsushi
Department of Materials Science and Engineerneering, Interdisciplinary Graduate School of Science an
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Irie Makoto
Nagaoka Univerity Of Technology Kamitomioka
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Morikawa Shuichi
Department of Cardiology Kyoto National Hospital
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Kamakura Yoshinari
Department Of Electronic Information And Energy Engineering Osaka University
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Nakano Hiroyuki
Department of Public Health, Nagasaki University School of Medicine
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WATANABE Tomokatsu
Department of Electrical Engineering, Osaka University
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IRIE Masatake
Department of Electrical Engineering, Osaka University
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TERAJI Tokuyuki
Department of Electrical Engineering, Osaka University
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Morikawa Shuichi
Department Of Electronics And Information Systems Osaka University
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RYOUKE Hironori
Department of Electronics and Information Systems,Osaka University
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NISHI Kenji
STARC
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NAGANO Hiroto
STARC
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Ishida Akihiro
Department Of Applied Physics The National Defense Academy
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Ishida Akihiro
Department Of Electronic Information And Energy Engineering Graduate School Of Eng. Osaka University
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Ito Toshimichi
Department Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka
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Teraji Tokuyuki
Department Of Electrical Engineering Graduate School Of Engineering Osaka University
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Sakamoto Takuya
Department Of Communications And Computer Engineering Graduate School Of Informatics
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Irie Masatake
Department Of Electrical Engineering Osaka University
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Nakano Hiroyuki
Department Of Public Health Nagasaki University School Of Medicine
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Sakamoto Takuya
Department Of Biotechnology Graduate School Of Agricultural And Life Sciences The University Of Toky
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Sakamoto Takuya
Department Of Electronics And Information Systems Osaka University
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Ryouke Hironori
Department Of Electronics And Information Systems Osaka University
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Nakano Hiroyuki
Department Of Earth And Space Science Graduate School Of Science Osaka University
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Nakano Hiroyuki
Department Of Electronics And Information Systems Osaka University
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KAMAKURA Yoshinari
Department of Electronic, Information and Energy Engineering, Osaka University
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Taniguchi Kenji
Department of Electronics and Information Systems, Osaka University
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TANIGUCHI Kenji
Department of Electronic, Information and Energy Engineering, Osaka University
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TANIGUCHI Kenji
Department of Electronics and Information Systems,Osaka University
著作論文
- Studies of Boron Segregation to {311} Defects in Silicon-Implanted Silicon
- Boron Segregation to {311} Defects Induced by Self-Implantation Damage in Si
- Boron Accumulation in the {311} Defect Region Induced by Self-Implantation into Silicon Substrate
- Impact Excitation of Carriers in Diamond under Extremely High Electric Fields
- Dependence of Gate Leakage Current on Location of Soft Breakdown Spot in Metal-Oxide-Semiconductor Field-Effect Transistor
- Effect of Oxide Breakdown on Complementary Metal Oxide Semiconductor Circuit Operation and Reliability
- A Study of Pre-Breakdown in Ultra-Thin Silicon Dioxide Films Using Carrier Separation Measurement
- Trap Density Dependent Inelastic Tunneling in Stress-Induced Leakage Current
- Trap Density Dependent Inelastic Tunneling in Stress-Induced Leakage Current
- Ensemble Monte Carlo/Molecular Dynamics Simulation of Inversion Layer Mobility in Si MOSFETs : Effects of Substrate Impurity(the IEEE International Coference on SISPAD '02)
- New Nondestructive Carrier Profiling for Ion Implanted Si Using Infrared Spectroscopic Ellipsometry
- Two-Dimensional Simulation of Quantum Tunneling across Barrier with Surface Roughness