DEGUCHI Kazuaki | Department of Electronics and Information Systems, Osaka University
スポンサーリンク
概要
関連著者
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TANIGUCHI Kenji
Department of Cancer Research, Fuji Gotemba Research Laboratories, Chugai and Pharmaceutical Co
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Kamakura Y
Department Of Electronics And Information Systems Osaka University
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Kamakura Yoshinari
Department Of Electronics And Information Systems Osaka University
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Kamakura Yoshinari
Department Of Electronic Information And Energy Engineering Graduate School Of Eng. Osaka University
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Taniguchi K
Department Of Electronic Information And Energy Engineering Graduate School Of Eng. Osaka University
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UNO Shigeyasu
Department of Electronic, Information and Energy Engineering, Graduate School of Eng., Osaka Univers
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DEGUCHI Kazuaki
Department of Electronics and Information Systems, Osaka University
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Uno Shigeyasu
Department Of Electronic Information And Energy Engineering Graduate School Of Eng. Osaka University
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Uno Shigeyasu
Department Of Electrical Engineering And Computer Science Graduate School Of Engineering Nagoya Univ
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Deguchi K
Department Of Electronics And Information Systems Osaka University
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Taniguchi Kenji
Department Of Biotechnology Tottori University
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Uno Shigeyasu
Department of Electrical and Computer Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Kamakura Yoshinari
Department of Electronic Engineering, Osaka University, Suita, Osaka 565-0871, Japan
著作論文
- Trap Density Dependent Inelastic Tunneling in Stress-Induced Leakage Current
- Trap Density Dependent Inelastic Tunneling in Stress-Induced Leakage Current