Temperature Dependence of Electron Mobility in Si Inversion Layers
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-11-15
著者
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Masaki K
Anan Coll. Technology Tokushima
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TANIGUCHI Kenji
Department of Cancer Research, Fuji Gotemba Research Laboratories, Chugai and Pharmaceutical Co
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Hamaguchi Chihiro
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Hamaguchi Chihiro
Deparimsnt Of Elecironics Facully Of Engineering Osaka University
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MASAKI Kazuo
Anan College of Technology
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IWASE Masao
ULSI Research Center, Toshiba Corporation
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Iwase Masao
Ulsi Research Center Toshiba Corporation
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Taniguchi Kenji
Department Of Biotechnology Tottori University
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