Influences of Point and Extended Defects on As Diffusion in Si(Structure and Mechanical and Thermal Properties of Condensed Matter)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-01-15
著者
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TSUJI Hiroshi
Department of Electronic Science and Engineering, Kyoto University
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Hirose Tetsuya
Department of Electrical and Electronics Engineering, Kobe University
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Tsuji Hiroshi
Department Of Electronics And Information Systems Osaka University
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TANIGUCHI Kenji
Department of Cancer Research, Fuji Gotemba Research Laboratories, Chugai and Pharmaceutical Co
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Taniguchi K
Osaka Univ. Osaka Jpn
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KIM Ryangsu
Department of Electronics and Information Systems, Osaka University
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SHANO Toshihumi
Department of Electronics and Information Systems, Osaka University
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Hirose Tetsuya
Department Of Electrical And Electronics Engineering Kobe University
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Kim Ryangsu
Department Of Electronics And Information Systems Osaka University
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Taniguchi Kenji
Department Of Biotechnology Tottori University
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Shano Toshihumi
Department Of Electronics And Information Systems Osaka University
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Tsuji Hiroshi
Department Of Applied Physics Faculty Of Engineering Osaka City University
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