A CMOS Watchdog Sensor for Certifying the Quality of Various Perishables with a Wider Activation Energy(<Special Section>Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)

概要

論文の詳細を見る
We developed a CMOS watchdog sensor that simulates the changes in quality of perishables such as farm and marine products. The sensor can imitate a chemical reaction that causes the changes in the quality of perishables, with a wide range of activation energy from 0.1eV to 0.7eV. Attached to perishable goods, the sensor simulates the deterioration of the goods caused by surrounding temperatures. By reading the output of the sensor, consumers can determine whether the goods are fresh or not. This sensor consists of subthreshold CMOS circuits with a low-power consumption of 5μW or less.
社団法人電子情報通信学会の論文
2006-04-01

著者

AMEMIYA Yoshihito
Department of Electrical Engineering, Hokkaido University
Amemiya Yoshihito
Graduate School Of Information Sci. & Technol. Hokkaido Univ.
Ueno Ken
Department of Electrical Engineering, Hokkaido University
Hirose Tetsuya
Department of Electrical and Electronics Engineering, Kobe University
Asai Tetsuya
Department of Electrical Engineering, Hokkaido University
Asai Tetsuya
Graduate School Of Information Science And Technology Hokkaido University
Hirose Tetsuya
Department Of Electrical And Electronics Engineering Kobe University
Amemiya Yoshihito
Department Of Electrical Engineering Faculty Of Engineering Hokkaido University
Asai Tetsuya
Department Of Electrical And Electronic Engineering Toyohashi University Of Technology
Ueno Ken
Department Of Electrical Engineering Hokkaido University
Hirose Tetsuya
Department Of Electrical Engineering Hokkaido University
Amemiya Yoshihito
Graduate School Of Information Science And Technology Hokkaido University
Hirose Tetsuya
Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe 657-8501, Japan

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A CMOS Watchdog Sensor for Certifying the Quality of Various Perishables with a Wider Activation Energy(<Special Section>Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)

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