Hot-Carrier Reliability Improvement in Submicron High-Voltage DMOS Transistors

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概要

• 論文の詳細を見る
• 2006-09-13

著者

• SU Yan-Kuin

  Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University

• CHEN Jone

  Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi

• Wu Kuo-ming

  Taiwan Semiconductor Manufacturing Company

• LEE J.

  Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University

• HSU S.

  Taiwan Semiconductor Manufacturing Company

• WU Kuo-Ming

  Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University

• WANG H.

  Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University

• LIN Y.

  Taiwan Semiconductor Manufacturing Company

• Chen Jone

  Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers

• Lee J.

  Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University

• Su Yan-kuin

  Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University

• Lee J.

  Institute Of Medical Science And Department Of Pediatrics Hallym University

• Su Yan-kuin

  Institute Of Electro-optical Science And Engineering Advance Optoelectronics Technology Center Natio

• Wang H.

  Institute Of Aeronautics And Astronautics National Cheng Kung University

• CHEN Jone

  Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University

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