Mechanism and Reliability Index of Hot-Carrier Degradation in LDMOS Transistors
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概要
- 論文の詳細を見る
- 2007-09-19
著者
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CHEN Jone
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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Wu Kuo-ming
Taiwan Semiconductor Manufacturing Company
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CHEN Shiang-Yu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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LEE J.
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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LIU C.
Taiwan Semiconductor Manufacturing Company
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HSU S.
Taiwan Semiconductor Manufacturing Company
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TIAN Kuen-Shiuan
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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WANG Wei-Chieh
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Chen Jone
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Wang Wei-chieh
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Lee J.
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Chen Shiang-yu
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Lee J.
Institute Of Medical Science And Department Of Pediatrics Hallym University
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Tian Kuen-shiuan
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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CHEN Jone
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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