Wu Kuo-ming | Taiwan Semiconductor Manufacturing Company
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概要
関連著者
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Wu Kuo-ming
Taiwan Semiconductor Manufacturing Company
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Chen Jone
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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LIU C.
Taiwan Semiconductor Manufacturing Company
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Chen Shiang-yu
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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HSU S.
Taiwan Semiconductor Manufacturing Company
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Lee J.
Institute Of Medical Science And Department Of Pediatrics Hallym University
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CHEN Jone
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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LEE J.
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Lee J.
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Tian Kuen-shiuan
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Wu Kuo-Ming
Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
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CHEN Jone
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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CHEN Shiang-Yu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Chen Shiang-Yu
Institute of Microelectronics, Department of Electrical Engineering, and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan
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Chen Shiang-Yu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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SU Yan-Kuin
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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TIAN Kuen-Shiuan
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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WANG Wei-Chieh
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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WU Kuo-Ming
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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WANG H.
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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LIN Y.
Taiwan Semiconductor Manufacturing Company
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Wang Wei-chieh
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Su Yan-kuin
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Su Yan-kuin
Institute Of Electro-optical Science And Engineering Advance Optoelectronics Technology Center Natio
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Wang H.
Institute Of Aeronautics And Astronautics National Cheng Kung University
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Huang Tsung-Yi
Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
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Hsu S.
Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
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Chen Jone
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Tian Kuen-Shiuan
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Tian Kuen-Shiuan
Institute of Microelectronics, Department of Electrical Engineering, and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan
著作論文
- Anomalous Hot-Carrier-Induced On-Resistance Degradation in High-Voltage LDMOS Transistors
- Mechanism and Reliability Index of Hot-Carrier Degradation in LDMOS Transistors
- Characteristics and improvement in hot-carrier reliability of sub-micrometer high-voltage double diffused drain metal-oxide-semiconductor field-effect transistors (Special issue: Solid state devices and materials)
- Hot-Carrier Reliability Improvement in Submicron High-Voltage DMOS Transistors
- Mechanism and Modeling of On-Resistance Degradation in n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors
- An Investigation on Hot-Carrier Reliability and Degradation Index in Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors
- Investigation of Hot-Carrier-Induced Degradation Mechanisms in p-Type High-Voltage Drain Extended Metal–Oxide–Semiconductor Transistors
- Effect of Gate Voltage on Hot-Carrier-Induced On-Resistance Degradation in High-Voltage n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors