Chen Shiang-Yu | Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
スポンサーリンク
概要
- Chen Shiang-Yuの詳細を見る
- 同名の論文著者
- Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwanの論文著者
関連著者
-
Wu Kuo-ming
Taiwan Semiconductor Manufacturing Company
-
LIU C.
Taiwan Semiconductor Manufacturing Company
-
HSU S.
Taiwan Semiconductor Manufacturing Company
-
Chen Jone
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
-
Chen Shiang-yu
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
-
Lee J.
Institute Of Medical Science And Department Of Pediatrics Hallym University
-
Wu Kuo-Ming
Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
-
Chen Shiang-Yu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
-
Tian Kuen-shiuan
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
-
Huang Tsung-Yi
Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
-
Hsu S.
Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
-
Chen Jone
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
-
Tian Kuen-Shiuan
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
著作論文
- An Investigation on Hot-Carrier Reliability and Degradation Index in Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors
- Effect of Gate Voltage on Hot-Carrier-Induced On-Resistance Degradation in High-Voltage n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors