Huang Tsung-Yi | Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan

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概要

関連著者

Wu Kuo-ming
Taiwan Semiconductor Manufacturing Company
LIU C.
Taiwan Semiconductor Manufacturing Company
HSU S.
Taiwan Semiconductor Manufacturing Company
Chen Jone
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
Chen Shiang-yu
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
Lee J.
Institute Of Medical Science And Department Of Pediatrics Hallym University
Tian Kuen-shiuan
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
Wu Kuo-Ming
Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
Huang Tsung-Yi
Taiwan Semiconductor Manufacturing Company, Hsinchu 300, Taiwan
Chen Shiang-Yu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
Tian Kuen-Shiuan
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan

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著作論文

An Investigation on Hot-Carrier Reliability and Degradation Index in Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors

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