AlGaN Ultraviolet Metal-Semiconductor-Metal Photodetectors with Low-Temperature-Grown Cap Layers

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概要

• 論文の詳細を見る
• 2006-09-13

著者

• LIN Ray-Ming

  Department of Electronic Engineering and Green Technology Research Center, Chang Gung University

• CHANG Shoou-Jinn

  Institute of Electro-Optical Science and Engineering, Center for Micro/Nano Science and Technology,

• Lin Ray-ming

  Department Of Electrical Engineering National Central University

• Lin Ray-ming

  Department. Of Electronics Engineering Chang Gung University

• HUNG Hung

  Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University

• LIN Yi-Chao

  Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University

• Chang Shoou-jinn

  Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na

• KUAN Hon

  Department of Electrical Engineering, Far East University

• WU Ming-Hsien

  Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi

• CHEN Chin-Hsaing

  Department. of Electronics Engineering, Cheng Shiu University

• Kuan Hon

  Department. Of Electrical Engineering. Far East College

• Wu Ming-hsien

  Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit

• Lin Yi-chao

  Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit

• Chang Shoou-jinn

  Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit

• Chen Chin-hsaing

  Department. Of Electronics Engineering Cheng Shiu University

• Hung Hung

  Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung University

• Kuan Hon

  Department of Electrical Engineering Far East College, Tainan 744, Taiwan

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