Novel Method for Monitoring the Surface Roughness during Molecular Beam Epitaxy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-03-15
著者
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LIN Ray-Ming
Department of Electronic Engineering and Green Technology Research Center, Chang Gung University
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Lin R‐m
Chang Gung Univ. Tao‐yuan Twn
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Lin Ray-ming
Department Of Electrical Engineering National Central University
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LEE Si-Chen
Department of Electrical Engineering Graduate Institute of Electronics Engineering, National Taiwan
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Lee Si-chen
Department Of Electrical Engineering National Taiwan University
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Lee Si-chen
Department Of Electrical Engineering & Graduate Institute Of Electronics Engineering National Ta
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