Optoelectronic Properties of Thermally Evaporated ZnO Films with Nanowalls on Glass Substrates
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概要
- 論文の詳細を見る
Zinc oxide (ZnO) films with two-dimensional (2D) vertically aligned nanowalls, denoted by nanowalls-films, are successfully prepared on glass substrates at a low growth temperature of 450 °C without using metal catalysts. The morphology and optical properties of the nanowalls-film are characterized by scanning electron microscopy, X-ray diffraction analysis, transmission electron microscopy, energy dispersive X-ray spectroscopy, and photoluminescence measurement. The ZnO nanowalls-film show a strong UV emission and a preferred c-axis orientation with a hexagonal structure. The UV sensor measurement of the ZnO nanowalls-film shows a high sensitivity to UV light, rapid rise and decay times, and a good UV-to-visible rejection ratio.
- 2013-04-25
著者
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Hung Fei-yi
Department Of Material Science And Engineering National Cheng Kung University
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Chen Tse-pu
Institute Of Microelectronics National Cheng Kung University
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Hu Zhan-shuo
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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CHANG Sheng-Po
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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Hu Zhan-Shuo
Institute of Microelectronics, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
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Chen Kuan-Jen
The Instrument Center, National Cheng Kung University, Tainan 701, Taiwan
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Chen Tse-Pu
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan
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Hung Fei-Yi
Department of Materials Science and Engineering, Institute of Nanotechnology and Microsystems Engineering, Center for Micro/Nano Science and Engineering, National Cheng Kung University, Tainan 701, Taiwan
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