The Bias-Crystallization Mechanism on Structural Characteristics and Electrical Properties of Zn-In-Sn-O Film
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概要
- 論文の詳細を見る
- 2011-08-01
著者
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Hung Fei-yi
Institute Of Nanotechnology And Microsystems Engineering Center For Micro/nano Science And Technolog
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Lui Truan‐sheng
Department Of Materials Science And Engineering National Cheng Kung University
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Lui T‐s
National Cheng Kung Univ. Tainan Twn
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Hung Fei-yi
Department Of Material Science And Engineering National Cheng Kung University
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Lui Truan-sheng
Department Of Material Science And Engineering National Cheng Kung University
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Hu Zhan-shuo
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Chen Kuan-jen
Institute Of Microelectronics National Cheng Kung University
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Chen Kuan-jen
Institute Of Mechanical And Electromechanical Engineering National Formosa University
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Hung Fei-yi
Institute Of Nanotechnology And Microsystems Engineering Center For Micro/nano Science And Technolog
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Lui Truan-sheng
Dep. Of Materials Sci. And Engineering National Cheng Kung Univ.
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Hung Fei-yi
Inst. Of Nanotechnology And Microsystems Engineering National Cheng Kung Univ.
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