Leakage Mechanism of Local Junctions Forming the Main or Tail Mode of Retention Characteristics for Dynamic Random Access Memories

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2000-04-30

著者

• Ueno Shin-ichi

  Department Of Electrical And Electronics Engineering Tokyo Institute Of Technology

• INUISHI Masahide

  ULSI Laboratory, Mitsubishi Electric Corporation

• INOUE Yasuo

  ULSI Development Center, Mitsubishi Electric Corporation

• TSUBOUCHI Natsuro

  ULSI Laboratory, Mitsubishi Electric Corporation

• Inoue Yasuo

  Lsi Research & Development Laboratory Mitsubishi Electric Corporation

• Ueno Shuichi

  Tokyo Inst. Of Technol. Tokyo Jpn

• UENO Shuichi

  ULSI Development Center, Mitsubishi Electric Corporation

• Tsubouchi Natsuro

  Ulsi Development Center Mitsubishi Electric Corporation

• IZUMI Yoshitaka

  NHK Science and Technical Research Laboratories

• Iwai Yuki

  Dep. Of Electronics And Bioinformatics Sci. And Technol. Meiji Univ.

• Inuishi Masahide

  Ulsi Development Center Mitsubishi Electric Corporation

• Inoue Yasuo

  Ulsi Development Center Mitsubishi Electric Corporation

• Ueno Shuichi

  Ulsi Development Center Mitsubishi Electric Corporation

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