A High Density High Performance Cell for 4M Bit Full Feature Electrically Erasable/Programmable Read-Only Memory

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The Influence of the Buried Oxide Defects on the Gate Oxide Reliability and Drain Leakage Currents of the Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
Low-Voltage Operation of a High-Resistivity Load SOI SRAM Cell by Reduced Back-Gate-Bias Effect
Two-Dimensional Analytical Modeling of the Source/Drain Engineering Influemce on Short-Channel Effects in SOI MOSFET's
Analytical Modeling of Short-Channel Behavior of Accumulation-Mode Transistors on Silicon-on-Insulator Substrate
Property of Radiation-Induced Defects in Germanium Single Crystals
Full Multiple-Scattering Approach to Na K-Edge XANES of NaCl-KCl Mixed Crystal
Novel Process for High-Density Buried Nanopyramid Array Fabrication by Means of Dopant Ion Implantation and Wet Etching
Nonscalability of Alpha-Particle-Induced Charge Collection Area
Reverse-Mode Single Ion Beam Induced Charge (R-mode SIBIC) Imaging for the Test of Total Dose Effects in n-ch Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET)
Optimization of Nitridation and Reoxidation Conditions for EEPROM^* Tunneling Dielectric
A High Density High Performance Cell for 4M Bit Full Feature Electrically Erasable/Programmable Read-Only Memory
Point Defects in Cubic Boron Nitride after Neutron Irradiation
Scalability of Gate/N^- Overlapped Lightly Doped Drain in Deep-Submicrometer Regime
Subquarter-micrometer Dual Gate Complementary Metal Oxide Semiconductor Field Effect Transistor with Ultrathin Gate Oxide of 2 nm
Deep Submicron Field Isolation with Buried Insulator between Polysilicon Electrodes (BIPS) (Special Section on High Speed and High Density Multi Functional LSI Memories)
Single-Event Upset Test of Static Random Access Memory Using Single-Ion Microprobe
Site Dependence of Soft Errors Induced by Single-Ion Hitting in 64 kbit Static Random Access Memory (SRAM)
New P-MOSFET Hot-Carrier Degradation Model for Bi-Directional Operation
Application of Proximity Effect Correction Usirng Pattern-Area Density to Patterning on a Heavy-Metal Substrate and the Cell-Projection Exposure
Improved Array Architectures of DINOR for 0.5 μm 32 M and 64 Mbit Flash Memories (Special Section on High Speed and High Density Multi Functional LSI Memories)
Memory Array Architecture and Decoding Scheme for 3 V Only Sector Erasable DINOR Flash Memory (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994))
Chemical Bonds at and Near the SiO_2/Si Interface
Optical Absorption in Silicon Oxide Film Near the SiO_2/Si Interface
Optical Absorption in Ultrathin Silicon Oxide Film (SOLID STATE DEVICES AND MATERIALS 1)
Leakage Mechanism of Local Junctions Forming the Main or Tail Mode of Retention Characteristics for Dynamic Random Access Memories
Fabrication of HfC-Coated Si Field Emitter Arrays with Built-in Poly-Si Thin-Film Transistor
Fabrication of Polycrystalline Silicon Field Emitter Arrays with Hafnium Carbide Coating for Thin-Film-Transistor Controlled Field Emission Displays
Mechanism of Tungsten Plug Corrosion during Chemical Stripping Process : Scanning Maxwell-Stress Microscopy and Electrochemical Potentiometry Studies
Charging Damage of Silicon-on-Insulator (SOI) Wafer Determined by Scanning Maxwell-Stress Microscopy
CHF_3 Plasma Treatment of Si Field Emitter Arrays For No Damage Vacuum Packaging
Electrical Characteristics of Air-Bridge-Structured Silicon Nanowire Fabricated by Micromachining a Silicon-on-Insulator Substrate
Fabrication of a Nanometer-Scale Si-Wire by Micromachining of a Silicon-on-Insulator Substrate
Bipolar Transistor with a Buried Layer Formed by High-Energy Ion Implantation for Subhalf-Micron Bipolar-Complementary Metal Oxide Semiconductor LSIs
The Impact of Nitrogen Implantation into Highty Doped Polysilicon Gates for flighty Reliable and High-Performance Sob-Quarter-Micron Dual-Gate Complementary Metal Oxide Semiconductor
A 0.4 μm Gate-All-Around TFT (GAT) Using a Dummy Nitride Pattern for High-Density Memories
Low-Temperature Characteristics of Buried-Channel Charge-Coupled Devices
Cationic Core Excitons in NaBr and MgBr_2
X-Ray K Absorption Edge Structures of Chlorine Ion in [CoCl_2(en)_2]NO_3,[CoCl_2(en)_2]Cl and [Co (en)_3]Cl_3・3H_2O
Review of Device Technologies of Flash Memories(Special Issue on Nonvolatile Memories)

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