Measurement of Energetic and Lateral Distribution of Interface State Density in Fully-Depleted Silicon on Insulator Metal-Oxide-Semiconductor Field-Effect Transistors

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1999-04-30

著者

• Shi Yi

  Institute Of Industrial Science University Of Tokyo:department Of Physics Nanjing University

• Duyet Tran

  Institute Of Industrial Science University Of Tokyo

• Hiramoto Toshiro

  Institute Of Industrial Science University Of Tokyo

• Hiramoto Toshiro

  Institute Of Industrial Science The University Of Tokyo

• Shi Yi

  Institute Of Biophysics Academia Sinica

• ISHIKURO Hiroki

  Institute of Industrial Science, University of Tokyo

• SARAYA Takuya

  Institute of Industrial Science, University of Tokyo

• TAKAMIYA Makoto

  Institute of Industrial Science, University of Tokyo

• SARAYA Takuya

  The Institute of Industrial Science, The University of Tokyo

• Ishikuro H

  Univ. Tokyo Tokyo Jpn

• Ishikuro Hiroki

  Institute Of Industrial Science University Of Tokyo

• Takamiya Makoto

  Institute Of Industrial Science University Of Tokyo

• Takamiya Makoto

  Institute Of Industrial Science The University Of Tokyo

• Saraya Takuya

  The Institute Of Industrial Science The University Of Tokyo

• SARAYA Takuya

  Institute Industrial Science, The University of Tokyo

• HIRAMOTO Toshiro

  Institute Industrial Science, The University of Tokyo

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