Ishikuro H | Univ. Tokyo Tokyo Jpn

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概要

• ISHIKURO Hirokiの詳細を見る
• 同名の論文著者
• Univ. Tokyo Tokyo Jpnの論文著者

関連著者

• Hiramoto Toshiro

  Institute Of Industrial Science University Of Tokyo

• ISHIKURO Hiroki

  Institute of Industrial Science, University of Tokyo

• Ishikuro H

  Univ. Tokyo Tokyo Jpn

• Hiramoto Toshiro

  Institute Of Industrial Science The University Of Tokyo

• Ishikuro Hiroki

  Institute Of Industrial Science University Of Tokyo

• HIRAMOTO Toshiro

  Institute Industrial Science, The University of Tokyo

• SARAYA Takuya

  Institute of Industrial Science, University of Tokyo

• Shi Yi

  Institute Of Industrial Science University Of Tokyo:department Of Physics Nanjing University

• Shi Yi

  Institute Of Biophysics Academia Sinica

• SARAYA Takuya

  The Institute of Industrial Science, The University of Tokyo

• Saraya Takuya

  The Institute Of Industrial Science The University Of Tokyo

• SARAYA Takuya

  Institute Industrial Science, The University of Tokyo

• SAITO Keisuke

  Application Laboratory

• Saito Keisuke

  Application Laboratory Analytical Division Philips Japan Ltd.

• Saito K

  Institute Of Industrial Science University Of Tokyo

• SAITO Kenichi

  Institute of Industrial Science, University of Tokyo

• Saito Kenichi

  Institute Of Industrial Science University Of Tokyo

• Saito Kunio

  Ntt Microsystem Integration Laboratories

• Saito K

  Akita Univ. Akita Jpn

• Saito Keisuke

  Application Laboratory Bruker Axs

• Duyet Tran

  Institute Of Industrial Science University Of Tokyo

• IKOMA Toshiaki

  Texas Instruments Tsukuba R&D Center

• TAKAMIYA Makoto

  Institute of Industrial Science, University of Tokyo

• Takamiya Makoto

  Institute Of Industrial Science University Of Tokyo

• Takamiya Makoto

  Institute Of Industrial Science The University Of Tokyo

• Ikoma T

  Univ. Tokyo Tokyo Jpn

• Ikoma Toshiaki

  The Institute Of Industrial Science The University Of Tokyo

• HASHIGUCHI Gen

  Institute of Industrial Science, University of Tokyo

• Fujii T

  Institute Of Industrial Science University Of Tokyo

• FUJII Tomoyuki

  Institute of Industrial Science, University of Tokyo

• HASHIGUCHI Gen

  Faculty of Engineering, Kagawa University

• TAKAHASHI Nobuyoshi

  Institute of Industrial Science, University of Tokyo

• Fujii T

  Tohoku Univ. Sendai Jpn

• Hashiguchi G

  Faculty Of Engineering Kagawa University

• Hiramoto Toshiro

  The Institute Of Industrial Science The University Of Tokyo:vlsi Design And Education Center The Uni

• IKOMA Toshiaki

  Institute of Industrial Science, University of Tokyo

• SAITOH Masumi

  Institute of Industrial Science, University of Tokyo

• YASUDA Yuri

  Institute of Industrial Science, University of Tokyo

• INUKAI Takashi

  The Institute of Industrial Science, The University of Tokyo

• INUKAI Takashi

  Institute of Industrial Science, University of Tokyo

• NAGATA Eiji

  Institute of Industrial Science, University of Tokyo

• Inukai T

  The Institute Of Industrial Science The University Of Tokyo

• Nagata Eiji

  Institute Of Industrial Science University Of Tokyo:chuo University

• Yasuda Yuri

  Institute Of Industrial Science University Of Tokyo:chuo University

• Inukai Takashi

  Institute Of Industrial Science The University Of Tokyo

• Ikoma Toshiaki

  Institute Of Industrial Science The University Of Tokyo

• Takahashi N

  Institute Of Industrial Science University Of Tokyo

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著作論文

• Room Temperature Coulomb Blockade and Low Temperature Hopping Transport in a Multiple-Dot-Channel Metal-Oxide-Semiconductor Field-Effect-Transistor ( Quantum Dot Structures)
• Fabrication of Si Nanostructures for Single Electron Device Applications by Anisotropic Etching
• Characteristic Distributions of Narrow Channel Metal-Oxide-Semiconductor Field-Effect Transistor Memories with Silicon Nanocrystal Floating Gates
• Measurement of Energetic and Lateral Distribution of Interface State Density in Fully-Depleted Silicon on Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
• Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
• Suppression of Geometric Component of Charge Pumping Current in Thin Film Silicon on Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
• Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
• Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based Metal-Oxide-Semiconductor Diodes
• Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
• Extremely Large Amplitude Random Telegraph Signals in a Very Narrow Split-Gate MOSFET at Low Temperatures
• Extremely Large Amplitude of Random Telegraph Signals in a Very Narrow Split-Gate MOSFET at Low Temperatures
• Large Electron Addition Energy above 250 meV in a Silicon Quantum Dot in a Single-Electron Transistor

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