Duyet Tran | Institute Of Industrial Science University Of Tokyo
スポンサーリンク
概要
関連著者
-
Duyet Tran
Institute Of Industrial Science University Of Tokyo
-
SARAYA Takuya
Institute of Industrial Science, University of Tokyo
-
Takamiya Makoto
Institute Of Industrial Science The University Of Tokyo
-
SARAYA Takuya
Institute Industrial Science, The University of Tokyo
-
Hiramoto Toshiro
Institute Of Industrial Science The University Of Tokyo
-
TAKAMIYA Makoto
Institute of Industrial Science, University of Tokyo
-
SARAYA Takuya
The Institute of Industrial Science, The University of Tokyo
-
Takamiya Makoto
Institute Of Industrial Science University Of Tokyo
-
Saraya Takuya
The Institute Of Industrial Science The University Of Tokyo
-
HIRAMOTO Toshiro
Institute Industrial Science, The University of Tokyo
-
Hiramoto Toshiro
Institute Of Industrial Science University Of Tokyo
-
Ishikuro Hiroki
Institute Of Industrial Science University Of Tokyo
-
Shi Yi
Institute Of Biophysics Academia Sinica
-
ISHIKURO Hiroki
Institute of Industrial Science, University of Tokyo
-
Ishikuro H
Univ. Tokyo Tokyo Jpn
-
Shi Yi
Institute Of Industrial Science University Of Tokyo:department Of Physics Nanjing University
-
Yasuda Yukio
School Of Electrical Engineering And Electronics Toyohashi University Of Technology
-
Hiramoto Toshiro
Vlsi Design And Education Center University Of Tokyo
-
YASUDA Yuri
Institute of Industrial Science, University of Tokyo
-
Yasuda Y
Univ. Tokyo Tokyo Jpn
-
Yasuda Yuri
Institute Of Industrial Science University Of Tokyo:chuo University
-
Hiramoto Toshiro
Vlsi Design And Education Center The University Of Tokyo
-
Shi Yi
Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan
-
Saraya Takuya
Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106-8558, Japan
著作論文
- High Performance Accumulated Back-Interface Dynamic Threshold SOI MOS-FET's (AB-DTMOS) with Large Body Effect at Low Supply Voltage
- Measurement of Energetic and Lateral Distribution of Interface State Density in Fully-Depleted Silicon on Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
- High-Performance Accumulated Back-Interface Dynamic Threshold SOI MOSFET (AB-DTMOS) with Large Body Effect at Low Supply Voltage
- Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
- Suppression of Geometric Component of Charge Pumping Current in Thin Film Silicon on Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
- New Measurement Technique for Sub-Bandgap Impact Ionization Current by Transient Characteristics of Partially Depleted SOI MOSFETs
- Measurement of Energetic and Lateral Distribution of Interface State Density in Fully-Depleted Silicon on Insulator Metal-Oxide-Semiconductor Field-Effect Transistors