Enhancement of Strain Relaxation of SiGe Thin Layers by Pre-Ion-Implantation into Si Substrates
スポンサーリンク
概要
- 論文の詳細を見る
- 2003-07-01
著者
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SAWANO Kentarou
Department of Applied Physics, The University of Tokyo
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HIROSE Yoshihisa
Musashi Institute of Technology
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OZAWA Yusuke
Musashi Institute of Technology
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KOH Shinji
Department of Applied Physics, The University of Tokyo
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YAMANAKA Junji
Center for Crystal Science and Technology, University of Yamanashi
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NAKAGAWA Kiyokazu
Center for Crystal Science and Technology, University of Yamanashi
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HATTORI Takeo
Musashi Institute of Technology
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SHIRAKI Yasuhiro
Department of Applied Physics, The University of Tokyo
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Sawano Kentarou
Research Center For Silicon Nano-science Advanced Research Laboratories Musashi Institute Of Technol
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Ozawa Yusuke
Research Center For Silicon Nano-science Advanced Research Laboratories Musashi Institute Of Technol
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Hoshi Yusuke
Research Center For Silicon Nano-science Advanced Research Laboratories Musashi Institute Of Technol
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Nakagawa Kenichi
Liquid Ctystal Laboratories Sharp Corporation
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Hirose Yoshihisa
Research Center For Silicon Nano-science Advanced Research Laboratories Musashi Institute Of Technol
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Koh S
Institute For Solid State Physics University Of Tokyo
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Shiraki Y
Research Center For Silicon Nano-science Advanced Research Laboratories Musashi Institute Of Technol
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Koh S
The University Of Tokyo
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Koh Shinji
Department Of Applied Physics The University Of Tokyo
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Yamanaka J
Center For Crystal Science And Technology University Of Yamanashi
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Shiraki Yasuhiro
Department Of Applied Physics And Physico-informatics Keio University
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Nakagawa K
Center For Crystal Science And Technology University Of Yamanashi
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Yamanaka Junji
Center for Crystal Science and Technology, Faculty of Engineering, University of Yamanashi, Kofu 400-8511, Japan
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Nakagawa Kiyokazu
Center for Crystal Science and Technology, Faculty of Engineering, University of Yamanashi, Kofu 400-8511, Japan
関連論文
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- Observation of Band Alignment Transition from Type-I to Type-II in AlInAs/AlGaAs Self-assembled Quantum Dots
- Characterization of amorphous-Si/1ML-Ge/Si(001) Interface Structure by X-ray Standing Waves
- Enhancement of Strain Relaxation of SiGe Thin Layers by Pre-Ion-Implantation into Si Substrates
- Three-Dimensional Reconstruction of Atoms in Surface X-Ray Diffraction
- A Novel Triple δ-Doped SiGe Heterostructure Field-Effect Transistor
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- Observation of Pronounced Effect of Compressive Strain on Room-Temperature Transport Properties of Two-Dimensional Hole Gas in a Strained Ge Quantum Well
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- Quantitative Evaluation of Silicon Displacement Induced by Arsenic Implantation Using Silicon Isotope Superlattices
- Demonstration of holes in strained Ge quantum wells with much higher drift mobility and density than that of electrons in strained Si channels
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